• DocumentCode
    3490520
  • Title

    Impurities in electrical trees grown in field-aged cables

  • Author

    Crine, J.-P. ; Haridoss, S. ; Hinrichsen, P. ; Houdayer, A. ; Kajrys, G.

  • Author_Institution
    Hydro Quebec, Varennes, Que., Canada
  • fYear
    1988
  • fDate
    16-20 Oct 1988
  • Firstpage
    94
  • Lastpage
    100
  • Abstract
    The micro-PIXE (proton-induced X-ray emission) facility of the University of Montreal was used to evaluate the impurity content in and out of electrical trees and the breakdown channels grown in a few field-aged cross-linked polyethylene cables. In a typical case, high amounts of Cl, Mg, Al, and K were detected in the electrical tree growing from a water tree. A wide dispersion of local impurity contents was observed in and out of the tree. In breakdown channels, traces of metallic conductor and concentric neutral as well as Si, Cl, K and Ca were observed in the carbonized walls of the channels. It is concluded that from this preliminary study it is difficult to determine whether some specific impurities may enhance the initiation of electrical tree, although very high amounts of chlorine, potassium, and calcium were detected in the studied trees
  • Keywords
    X-ray chemical analysis; aluminium; cable insulation; calcium; chlorine; insulation testing; ion microprobe analysis; magnesium; organic insulating materials; polymers; potassium; power cables; silicon; Al; Ca; Cl; K; Mg; Si; XLPE; breakdown channels; carbonized walls; cross-linked polyethylene cables; electrical trees; field-aged cables; impurity content; micro-PIXE; proton-induced X-ray emission; Cables; Dielectrics and electrical insulation; Electric breakdown; Impurities; Land surface temperature; Nitrogen; Particle beams; Protons; Surface contamination; Trees - insulation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 1988. Annual Report., Conference on
  • Conference_Location
    Ottawa, Ont.
  • Type

    conf

  • DOI
    10.1109/CEIDP.1988.26314
  • Filename
    26314