Title :
A study of floating-body effects on inverter chain delay
Author :
Schiebel, Richard A. ; Houston, Theodore W. ; Rajgopal, Rajan ; Joyner, Keith ; Fossum, Jerry G. ; Suh, Dongwook ; Krishnan, Srinath
Author_Institution :
Texas Instrum. Inc., Dallas, TX, USA
Abstract :
Sub and Fossum (1994) predicted that floating-body effects in partially depleted (PD) SOI transistors will cause the performance of a PD/SOI circuit to depend on its recent history. The voltage of the floating body affects the threshold voltage Vt which results in hysteretic dependence of leakage current and gate delay. The interactions are complex, and experimental data are needed to confirm the model and establish the significance of the effects on circuit performance. The purpose of this work is to advance understanding of hysteretic floating-body effects, the interplay of time constants involved in these processes, and their impact on circuit performance
Keywords :
delays; digital integrated circuits; hysteresis; integrated logic circuits; leakage currents; logic gates; silicon-on-insulator; SOI circuit performance; Si; floating-body effects; gate delay; hysteretic dependence; inverter chain delay; leakage current; partially depleted SOI transistors; threshold voltage; time constants; Circuit optimization; Delay effects; Hysteresis; Instruments; Lighting; Pulse generation; Pulse inverters; Pulse measurements; Steady-state; Threshold voltage;
Conference_Titel :
SOI Conference, 1995. Proceedings., 1995 IEEE International
Conference_Location :
Tucson, AZ
Print_ISBN :
0-7803-2547-8
DOI :
10.1109/SOI.1995.526492