DocumentCode :
3490542
Title :
Matching points in poor edge information images
Author :
Posse, Alberto ; Torres, Juan ; Menéndez, José Manuel
Author_Institution :
Grupo de Aplicacion de Telecomun. Visuales, Univ. Politec. de Madrid, Madrid, Spain
fYear :
2009
fDate :
7-10 Nov. 2009
Firstpage :
197
Lastpage :
200
Abstract :
Pattern matching and image patches correspondence have been described in several papers. However, in most cases the results are obtained using images with high level of detail, in other words, images with useful edge information. This paper describes a method to find correspondences between images with very poor edge information -for instance a painting with a cloudless sky- and its application to reflectographic images mosaicing. Unlike other pattern matching techniques, the proposed method solves the issue of low levels of detail or lack of good information, both needed for the determination of the correspondences used by common likeness measure (cross-norm correlation), features correspondence (Harris, SUSAN) and object recognition methods. Thus, intensity-augmented ordinal measure method is used: a window-based noise-robust method to calculate matching points. This method is improved with our Point Structure Selection (PSS) procedure to select good correspondences and reject false positives.
Keywords :
edge detection; image matching; image patches; matching points; object recognition methods; pattern matching; point structure selection; poor edge information images; reflectographic images mosaicing; Cameras; Computer vision; Image resolution; Layout; Noise measurement; Object recognition; Painting; Pattern matching; Radiometry; Telecommunications; Pattern matching; infrared reflectography; ordinal measure;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Image Processing (ICIP), 2009 16th IEEE International Conference on
Conference_Location :
Cairo
ISSN :
1522-4880
Print_ISBN :
978-1-4244-5653-6
Electronic_ISBN :
1522-4880
Type :
conf
DOI :
10.1109/ICIP.2009.5414221
Filename :
5414221
Link To Document :
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