Title :
Smart-power solenoid driver for 300°C operation
Author :
Maszara, W.P. ; Boyko, D. ; Caviglia, A. ; Goetz, G. ; McKitterick, J.B. ; Connor, J.O.
Author_Institution :
Allied-Signal Aerosp. Co., Columbia, MD, USA
Abstract :
A 28 volt solenoid driver has been realized in partially-depleted SOI CMOS technology. The design features an n-channel high voltage MOSFET with an extended drain and a polysilicon field plate, and an on-board flyback diode, each capable of sinking 0.5 A of current and dissipating about 1 W of DC power. Pulse-width modulation (PWM) control maintains low dynamic power dissipation in the drive FET, while the externally selectable “pull-in and hold” function, which reduces the maximum operating current, helps to minimize the overall chip power. Saturation detection, current sense, and overcurrent fault outputs are provided to assist the system designer. The device was fabricated on SIMOX wafers with 340 nm of Si film using our 1.25 μm CMOS SOI process with single level Ti/W interconnects and CoSi2 contacts. Our Ti/W metallization, capped with Si3N4 for corrosion protection, has been evaluated to have a lifetime of ~16.7 years for 300°C operation at 106 A/cm2 (a 10% resistance increase was the definition of failure). The output power transistor has been formed with our standard CMOS process. Its gate dimensions were L=2 μm and W=48,000 μm, with a drain extension of 2.8 μm
Keywords :
CMOS integrated circuits; SIMOX; driver circuits; fault location; integrated circuit metallisation; power integrated circuits; pulse width modulation; solenoids; 0.5 A; 1 W; 1.25 micron; 16.7 year; 28 V; 300 C; CoSi2; CoSi2 contacts; PWM control; SIMOX wafers; Si; Si3N4; Ti-W; corrosion protection; current sense; extended drain; high voltage MOSFET; n-channel HV MOSFET; onboard flyback diode; overcurrent fault output; partially-depleted SOI CMOS technology; polysilicon field plate; pulse-width modulation; saturation detection; single level Ti/W interconnects; smart-power solenoid driver; CMOS process; CMOS technology; Diodes; MOSFET circuits; Power MOSFET; Power dissipation; Pulse width modulation; Solenoids; Space vector pulse width modulation; Voltage;
Conference_Titel :
SOI Conference, 1995. Proceedings., 1995 IEEE International
Conference_Location :
Tucson, AZ
Print_ISBN :
0-7803-2547-8
DOI :
10.1109/SOI.1995.526495