DocumentCode :
3490570
Title :
New SOI structures for intelligent power ICs with vertical double-diffused MOS output devices
Author :
Kikuchi, Hiroaki ; Hamajima, Tomohiro ; Kobayashi, Kenya ; Takashi, M. ; Arai, Kenichi
Author_Institution :
ULSI Device Dev. Lab., NEC Corp., Sagamihara, Japan
fYear :
1995
fDate :
3-5 Oct 1995
Firstpage :
133
Lastpage :
134
Abstract :
Intelligent power ICs with vertical double-diffused MOS (VDMOS) output devices are used for solenoid controlled applications. Many structures have been proposed for these power ICs. We have developed poly-Si sandwiched bonded (PSB) structures which use a Sb doped poly-Si and crystal-Si bonding technique. However these PSB structures have a high fabrication cost, because the fabrication process includes Sb diffusion into poly-Si layers. In this paper, we first propose an improved fabrication process of PSB structures without Sb diffusion into poly-Si layers. Second, we propose a new SOI structure with gaps fabricated by a wafer direct bonding technique. Both structures enable us to obtain low-cost intelligent power ICs with VDMOS
Keywords :
MOS integrated circuits; power MOSFET; power integrated circuits; silicon; silicon-on-insulator; wafer bonding; SOI structures; Si; VDMOS output devices; fabrication process; gaps; intelligent power ICs; poly-Si sandwiched bonded structures; polysilicon; vertical double-diffused MOS; wafer direct bonding technique; Annealing; Conductivity; Fabrication; Heat treatment; Intelligent structures; Power integrated circuits; Semiconductor films; Substrates; Surface topography; Wafer bonding;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
SOI Conference, 1995. Proceedings., 1995 IEEE International
Conference_Location :
Tucson, AZ
Print_ISBN :
0-7803-2547-8
Type :
conf
DOI :
10.1109/SOI.1995.526496
Filename :
526496
Link To Document :
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