Fault location algorithms for repairable embedded RAMs

The authors´ research has led to: (1) the development of original rules for the conversion of single-bit march tests into multi-bit march tests; (2) the transformation of the new multi-bit march tests, using a `serial shifting notation´ which represents `serial access´ in embedded RAMs, into serial-access word-oriented march tests; and (3) the introduction of a new compact notation which extends the well-established march notation to include algorithms with two levels of FOR-loops (namely: the Galloping FOR-loop and the Hamming FOR-loop), since such algorithms are indispensible for locating coupling faults in cell arrays, and stuck-open faults in address decoders. Finally, a tabular summary (using both the `hybrid serial/parallel´ and the `modular´ data accessing modes) of fault location algorithms is given