Title :
Records of the 1993 IEEE International Workshop on Memory Testing (Cat. No.93TH0554-6)
Abstract :
The following topics were dealt with: test pattern generation; BIST and testable memory designs; test algorithms; fault models for memories; testing for process defects and yield improvement; radiation issues and space applications; and test techniques for SRAMs
Keywords :
automatic testing; built-in self test; fault location; integrated circuit testing; integrated memory circuits; monolithic integrated circuits; radiation effects; BIST; DRAM; SRAMs; TPG; dynamic RAM; fault models; process defects; radiation issues; space applications; static RAM; test algorithms; test pattern generation; testable memory designs; yield improvement;
Conference_Titel :
Memory Testing, 1993., Records of the 1993 IEEE International Workshop on
Conference_Location :
San Jose, CA, USA
Print_ISBN :
0-8186-4150-9
DOI :
10.1109/MT.1993.263159
