DocumentCode :
3490930
Title :
Impact of ASD settings in its LVRT behaviour
Author :
Carrillo, C. ; Vidal-Vilarino, F. ; Suárez-Álvarez, M. ; Saez-Tort, M. ; Díaz-Dorado, E.
Author_Institution :
Dept. of Electr. Eng., Univ. of Vigo, Vigo, Spain
fYear :
2010
fDate :
14-16 June 2010
Firstpage :
339
Lastpage :
342
Abstract :
A common matter of concern in industrial installations is that adjustable-speed drives (ASD) trip due to voltage sags. ASD manufacturers are including more and more in these devices settings related to control strategies (e.g. allowable DC voltage levels, etc) in order to improve their Low Voltage Ride Through (LVRT). These settings must be carefully adjusted in each installation in order to prevent any interference with the process where ASDs are used. In this paper, a method to establish the setting values to achieve a determined LVRT level has been done. A voltage sag generator developed by the part of the authors has been used to test several setting values and its impact on the process. Two commercial ASD installed in a factory were used during tests.
Keywords :
power supply quality; variable speed drives; ASD setting; LVRT behaviour; Low Voltage Ride Through; adjustable speed drives; industrial installations; voltage sag generator; voltage sags; Automotive engineering; Design automation; Electronics industry; Low voltage; Manufacturing automation; Manufacturing industries; Power quality; Testing; Variable speed drives; Voltage fluctuations; Adjustable Speed Drives; Low Voltage Ride Through; Power quality; Voltage sag;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Electronics Electrical Drives Automation and Motion (SPEEDAM), 2010 International Symposium on
Conference_Location :
Pisa
Print_ISBN :
978-1-4244-4986-6
Electronic_ISBN :
978-1-4244-7919-1
Type :
conf
DOI :
10.1109/SPEEDAM.2010.5545109
Filename :
5545109
Link To Document :
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