DocumentCode
3490939
Title
A new flicker test standard based on asynchronous sampling technology and compensation algorithm
Author
Lei, Wang ; Shufan, Zeng ; Jiangtao, Zhang ; Lijuan, Liu ; Hao, Zhou ; Min, Li ; Zuliang, Lu ; Shaoyuan, Zhou
Author_Institution
Harbin Inst. of Technol., Harbin, China
fYear
2010
fDate
13-18 June 2010
Firstpage
263
Lastpage
264
Abstract
This paper described a new flicker test standard developed in National Institute of Metrology (NIM) for the calibration of voltage fluctuation and flicker. It meets the requirement of both flickermeter and flicker source according to the IEC 61000-4-15.
Keywords
calibration; compensation; meters; IEC 61000-4-15; National Institute of Metrology; asynchronous sampling technology; compensation algorithm; flicker calibration; flicker source; flicker test standard; flickermeter; voltage fluctuation calibration; Coaxial components; Equations; IEC standards; Measurement standards; Metrology; Resistors; Sampling methods; Standards development; Testing; Voltage fluctuations;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements (CPEM), 2010 Conference on
Conference_Location
Daejeon
Print_ISBN
978-1-4244-6795-2
Type
conf
DOI
10.1109/CPEM.2010.5545110
Filename
5545110
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