DocumentCode :
3491014
Title :
MDL context modeling of images with application to denoising
Author :
Zhai, Guangtao ; Wu, Xiaolin ; Yang, Xiaokang ; Zhang, Wenjun
Author_Institution :
Dept. of Electr. & Comput. Eng., McMaster Univ., Hamilton, ON, Canada
fYear :
2009
fDate :
7-10 Nov. 2009
Firstpage :
3845
Lastpage :
3848
Abstract :
The lately popularized patch-based nonlocal (NL) image processing approach is cast into a framework of statistical context modeling, a thoroughly studied topic in data compression and information theory. The adaptation of image patch (context) to local waveform is crucial to the performance of NL-type of image processing but yet lacks a rigorous study. In this paper we propose a minimum description length (MDL) approach for choosing the size and spatial configuration of the context in which a degraded pixel is to be restored. The MDL criterion of context formation aims to strike an optimal balance between the variance and bias of the errors in fitting a 2D piecewise autoregressive (PAR) model to input image signal. To exemplify the use of the proposed context modeling technique in image processing, an MDL-guided context-based image denoiser is derived and its performance evaluated. Empirical results show that the new context-based denoiser is highly competitive against the current state of the art.
Keywords :
autoregressive processes; data compression; image coding; image denoising; information theory; statistical analysis; 2D piecewise autoregressive model; MDL context modeling; MDL guided context based image denoiser; data compression; image denoising; image patch; information theory; minimum description length; patch based nonlocal image processing; statistical context modeling; Application software; Context modeling; Data compression; Image communication; Image denoising; Image processing; Image restoration; Information theory; Noise reduction; Pixel;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Image Processing (ICIP), 2009 16th IEEE International Conference on
Conference_Location :
Cairo
ISSN :
1522-4880
Print_ISBN :
978-1-4244-5653-6
Electronic_ISBN :
1522-4880
Type :
conf
DOI :
10.1109/ICIP.2009.5414252
Filename :
5414252
Link To Document :
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