• DocumentCode
    3491126
  • Title

    Board-level solder joint reliability of high performance computers under mechanical loading

  • Author

    Newman, Keith

  • Author_Institution
    Sun Microsyst., Sunnyvale, CA
  • fYear
    2008
  • fDate
    20-23 April 2008
  • Firstpage
    1
  • Lastpage
    15
  • Abstract
    Several changes in high performance computer system design, construction and materials have resulted in potentially greater risk of solder joint failures under mechanical loading. In addition to mechanical/thermal challenges created by the increased volumetric density and power dissipation of components in the system assemblies, computer products increasingly include Pb-free solder and circuit board materials that are often more brittle than their Sn37Pb containing predecessors. Although servers and computer sub-assemblies are unlikely to witness severe impact loading under end-use conditions, high strain-rate events nonetheless occur during board assembly, test, handling and shipment. This paper provides a brief overview of characterization test methods, modeling approaches, and acceptance criteria used to establish component fracture strength, circuit board strain and solder joint reliability of electronic assemblies under various mechanical stress conditions. In addition, key parameters associated with optimization of solder joint brittle fracture strength are identified.
  • Keywords
    brittle fracture; fracture toughness; solders; board-level solder joint reliability; characterization test methods; circuit board materials; component fracture strength; computer products; computer subassemblies; electronic assemblies; high performance computer system design; impact loading; mechanical loading; power dissipation; solder joint brittle fracture strength; system assemblies; volumetric density; Assembly systems; Building materials; Circuit testing; Electronic equipment testing; High performance computing; Joining materials; Power dissipation; Power system reliability; Printed circuits; Soldering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Micro-Systems, 2008. EuroSimE 2008. International Conference on
  • Conference_Location
    Freiburg im Breisgau
  • Print_ISBN
    978-1-4244-2127-5
  • Electronic_ISBN
    978-1-4244-2128-2
  • Type

    conf

  • DOI
    10.1109/ESIME.2008.4525109
  • Filename
    4525109