DocumentCode :
3491126
Title :
Board-level solder joint reliability of high performance computers under mechanical loading
Author :
Newman, Keith
Author_Institution :
Sun Microsyst., Sunnyvale, CA
fYear :
2008
fDate :
20-23 April 2008
Firstpage :
1
Lastpage :
15
Abstract :
Several changes in high performance computer system design, construction and materials have resulted in potentially greater risk of solder joint failures under mechanical loading. In addition to mechanical/thermal challenges created by the increased volumetric density and power dissipation of components in the system assemblies, computer products increasingly include Pb-free solder and circuit board materials that are often more brittle than their Sn37Pb containing predecessors. Although servers and computer sub-assemblies are unlikely to witness severe impact loading under end-use conditions, high strain-rate events nonetheless occur during board assembly, test, handling and shipment. This paper provides a brief overview of characterization test methods, modeling approaches, and acceptance criteria used to establish component fracture strength, circuit board strain and solder joint reliability of electronic assemblies under various mechanical stress conditions. In addition, key parameters associated with optimization of solder joint brittle fracture strength are identified.
Keywords :
brittle fracture; fracture toughness; solders; board-level solder joint reliability; characterization test methods; circuit board materials; component fracture strength; computer products; computer subassemblies; electronic assemblies; high performance computer system design; impact loading; mechanical loading; power dissipation; solder joint brittle fracture strength; system assemblies; volumetric density; Assembly systems; Building materials; Circuit testing; Electronic equipment testing; High performance computing; Joining materials; Power dissipation; Power system reliability; Printed circuits; Soldering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Micro-Systems, 2008. EuroSimE 2008. International Conference on
Conference_Location :
Freiburg im Breisgau
Print_ISBN :
978-1-4244-2127-5
Electronic_ISBN :
978-1-4244-2128-2
Type :
conf
DOI :
10.1109/ESIME.2008.4525109
Filename :
4525109
Link To Document :
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