DocumentCode
3491126
Title
Board-level solder joint reliability of high performance computers under mechanical loading
Author
Newman, Keith
Author_Institution
Sun Microsyst., Sunnyvale, CA
fYear
2008
fDate
20-23 April 2008
Firstpage
1
Lastpage
15
Abstract
Several changes in high performance computer system design, construction and materials have resulted in potentially greater risk of solder joint failures under mechanical loading. In addition to mechanical/thermal challenges created by the increased volumetric density and power dissipation of components in the system assemblies, computer products increasingly include Pb-free solder and circuit board materials that are often more brittle than their Sn37Pb containing predecessors. Although servers and computer sub-assemblies are unlikely to witness severe impact loading under end-use conditions, high strain-rate events nonetheless occur during board assembly, test, handling and shipment. This paper provides a brief overview of characterization test methods, modeling approaches, and acceptance criteria used to establish component fracture strength, circuit board strain and solder joint reliability of electronic assemblies under various mechanical stress conditions. In addition, key parameters associated with optimization of solder joint brittle fracture strength are identified.
Keywords
brittle fracture; fracture toughness; solders; board-level solder joint reliability; characterization test methods; circuit board materials; component fracture strength; computer products; computer subassemblies; electronic assemblies; high performance computer system design; impact loading; mechanical loading; power dissipation; solder joint brittle fracture strength; system assemblies; volumetric density; Assembly systems; Building materials; Circuit testing; Electronic equipment testing; High performance computing; Joining materials; Power dissipation; Power system reliability; Printed circuits; Soldering;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Micro-Systems, 2008. EuroSimE 2008. International Conference on
Conference_Location
Freiburg im Breisgau
Print_ISBN
978-1-4244-2127-5
Electronic_ISBN
978-1-4244-2128-2
Type
conf
DOI
10.1109/ESIME.2008.4525109
Filename
4525109
Link To Document