Data-dependent jitter and crosstalk-induced bounded uncorrelated jitter in copper interconnects

Author

Buckwalter, James ; Analui, Behnam ; Hajimiri, Ali

Author_Institution

California Inst. of Technol., Pasadena, CA, USA

Volume

3

fYear

2004

fDate

6-11 June 2004

Firstpage

1627

Abstract

This paper resolves the jitter impairment of non-return-to-zero data in transmission lines. The limited bandwidth of the transmission line introduces data-dependent jitter. Crosstalk between neighbouring lines results in bounded uncorrelated jitter in the data eye. An analytical approach to representing data-dependent jitter and crosstalk-induced bounded uncorrelated jitter is presented. Comparison with jitter measurements of microstrip lines on FR4 board demonstrated accuracy to within 15% of the predictions for deterministic jitter.

Keywords

coupled transmission lines; crosstalk; electromagnetic coupling; jitter; microstrip lines; optical backplanes; optical interconnections; transmission line theory; FR4 board; analytical approach; copper interconnects; crosstalk-induced bounded uncorrelated jitter; data eye; data-dependent jitter; deterministic jitter; jitter impairment; jitter measurements; limited bandwidth; microstrip lines; non-return-to-zero data; transmission lines; Bandwidth; Copper; Couplings; Crosstalk; Integrated circuit interconnections; Jitter; Microstrip; Power transmission lines; Transmission line measurements; Very large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Symposium Digest, 2004 IEEE MTT-S International

ISSN

0149-645X

Print_ISBN

0-7803-8331-1

Type

conf

DOI

10.1109/MWSYM.2004.1338895

Filename

1338895