DocumentCode :
3491489
Title :
Efficient stimulus generation for testing embedded distributed systems the FlexRay example
Author :
Armengaud, Eric ; Steininger, Andreas ; Horauer, Martin
Author_Institution :
Embedded Comput. Syst. Group, Univ. of Technol. Vienna
Volume :
1
fYear :
2005
fDate :
19-22 Sept. 2005
Lastpage :
770
Abstract :
Embedded electronic communication systems play a vital role in the future development of automotive systems. For successful application developments new test and diagnosis solutions for these distributed systems are required. This paper presents solutions for the stimulus generation of test systems based on a remote test under the stringent constraints of the automotive industry. We elaborate a flexible and accurate method that enables a systematic and comprehensive test of data link layer related communication services. Furthermore, we discuss how this solution can be applied for various different test purposes (e.g. for verification, robustness, interoperability or maintenance tests) and demonstrate its application by use of an example that varies one fundamental protocol parameter of FlexRay
Keywords :
automobile industry; automotive electronics; embedded systems; fault diagnosis; protocols; FlexRay; automotive industry; automotive system; data link layer; embedded distributed system; embedded electronic communication system; Automotive engineering; Communication system control; Control systems; Costs; Embedded computing; Protocols; Robustness; Safety; System testing; Vehicles;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Emerging Technologies and Factory Automation, 2005. ETFA 2005. 10th IEEE Conference on
Conference_Location :
Catania
Print_ISBN :
0-7803-9401-1
Type :
conf
DOI :
10.1109/ETFA.2005.1612602
Filename :
1612602
Link To Document :
بازگشت