DocumentCode
3491548
Title
1.47 μm high characteristic temperature InGaAsP/InP MQW laser
Author
Chen, Weibo ; Li, Lin ; Zhao, Jinlong ; Wang, Yong ; Li, Te ; Lu, Peng ; Li, Mei ; Liu, GuoJun
Author_Institution
Nat. Key Lab. of High Power Semicond. Lasers, Changchun Univ. of Sci. & Technol., Changchun, China
fYear
2012
fDate
23-25 Aug. 2012
Firstpage
115
Lastpage
118
Abstract
LASTIP software was applied to simulate symmetric and asymmetric InGaAsP/InP multi-quantum-well (MQW) laser diodes (LDs) emitting at about 1.47 μm. In order to obtain the laser with high-temperature characteristic, the tunnel layer and inner cladding layer was inserted in the laser structure. By comparing the two structures, we found that the tunnel injection (TI) structure can effectively reduce hot carrier effects, the TI asymmetric SCH MQW lasers have good temperature characteristics and smaller threshold current.
Keywords
III-V semiconductors; claddings; gallium arsenide; hot carriers; indium compounds; laser beams; quantum well lasers; tunnelling; InGaAsP-InP; LASTIP software; MQW LD; TI asymmetric SCH MQW lasers; TI structure; asymmetric multiquantum-well laser diodes; high characteristic temperature; hot carrier effects; inner cladding layer; laser structure; symmetric multiquantum-well laser diodes; threshold current; tunnel injection structure; tunnel layer; wavelength 1.47 mum; Laser theory; Power lasers; Quantum well devices; Semiconductor lasers; Temperature; Threshold current; 1.47 μm; High Characteristic Temperature; InGaAsP/InP; TI; asymmetric SCH MQW;
fLanguage
English
Publisher
ieee
Conference_Titel
Optoelectronics and Microelectronics (ICOM), 2012 International Conference on
Conference_Location
Changchun, Jilin
Print_ISBN
978-1-4673-2638-4
Type
conf
DOI
10.1109/ICoOM.2012.6316230
Filename
6316230
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