DocumentCode
349167
Title
An integrated diagnostic reconfiguration (IDR) technique for fault tolerant mixed signal microsystems
Author
Sharif, Erfaan ; Dorey, Tony ; Richardson, Andrew
Author_Institution
Dept. of Eng., Lancaster Univ., UK
Volume
1
fYear
1998
fDate
1998
Firstpage
413
Abstract
An integrated diagnostic reconfiguration (IDR) approach is presented for mixed signal systems used in high dependability applications. The technique eliminates the need for multiple redundant devices. The approach has been used to implement a fault tolerant interface ASIC for a smart piezoresistive silicon pressure sensor used in an automotive application. The ASIC hardware has been combined with software modules implemented on a RISC microcontroller embedded in universal sensor interface circuit (USIC) to produce a working demonstrator. The conclusions considers limitations, benefits and further possible applications for the technique
Keywords
automotive electronics; fault tolerance; integrated circuit testing; microcontrollers; mixed analogue-digital integrated circuits; piezoelectric transducers; piezoresistive devices; pressure sensors; redundancy; RISC microcontroller; automotive application; fault tolerant interface ASIC; fault tolerant mixed signal microsystems; high dependability applications; integrated diagnostic reconfiguration; multiple redundant devices; piezoresistive pressure sensor; universal sensor interface circuit; Application software; Application specific integrated circuits; Automotive applications; Circuit faults; Embedded software; Fault tolerance; Hardware; Intelligent sensors; Piezoresistance; Silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics, Circuits and Systems, 1998 IEEE International Conference on
Conference_Location
Lisboa
Print_ISBN
0-7803-5008-1
Type
conf
DOI
10.1109/ICECS.1998.813352
Filename
813352
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