• DocumentCode
    349167
  • Title

    An integrated diagnostic reconfiguration (IDR) technique for fault tolerant mixed signal microsystems

  • Author

    Sharif, Erfaan ; Dorey, Tony ; Richardson, Andrew

  • Author_Institution
    Dept. of Eng., Lancaster Univ., UK
  • Volume
    1
  • fYear
    1998
  • fDate
    1998
  • Firstpage
    413
  • Abstract
    An integrated diagnostic reconfiguration (IDR) approach is presented for mixed signal systems used in high dependability applications. The technique eliminates the need for multiple redundant devices. The approach has been used to implement a fault tolerant interface ASIC for a smart piezoresistive silicon pressure sensor used in an automotive application. The ASIC hardware has been combined with software modules implemented on a RISC microcontroller embedded in universal sensor interface circuit (USIC) to produce a working demonstrator. The conclusions considers limitations, benefits and further possible applications for the technique
  • Keywords
    automotive electronics; fault tolerance; integrated circuit testing; microcontrollers; mixed analogue-digital integrated circuits; piezoelectric transducers; piezoresistive devices; pressure sensors; redundancy; RISC microcontroller; automotive application; fault tolerant interface ASIC; fault tolerant mixed signal microsystems; high dependability applications; integrated diagnostic reconfiguration; multiple redundant devices; piezoresistive pressure sensor; universal sensor interface circuit; Application software; Application specific integrated circuits; Automotive applications; Circuit faults; Embedded software; Fault tolerance; Hardware; Intelligent sensors; Piezoresistance; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics, Circuits and Systems, 1998 IEEE International Conference on
  • Conference_Location
    Lisboa
  • Print_ISBN
    0-7803-5008-1
  • Type

    conf

  • DOI
    10.1109/ICECS.1998.813352
  • Filename
    813352