Title :
Study on technique of measuring single grating incremental angle
Author :
Mu, Yining ; Wang, He
Author_Institution :
Sch. of Opt. Eng., Changchun Univ. of Sci. & Technol., Changchun, China
Abstract :
This paper discusses a new method of measuring incremental angle, which uses an arranged matrix of a narrow slit photoelectric cell according to certain logic phase combination replacing the fixed grating in the grating pair. The measuring operation can be accomplished by the coordination to replace between the coder disk and the arranged matrix of the narrow slit photoelectric cell. Thus, there is no need of considering the gap between the slit and the coder disk. The sensibility of the incremental photoelectric encoder to the vibration and the precision requirements of the spars are deduced. Thus the contrast degree of the Moors fringes is enhanced, the subdivision precision is increased and finally the measuring precision and the Stability are all increased.
Keywords :
angular measurement; diffraction gratings; photoelectric devices; vibrations; Moors fringes; arranged matrix; coder disk; grating pair; incremental photoelectric encoder; logic phase combination; measuring precision; measuring stability; single grating incremental angle measurement; slit photoelectric cell; subdivision precision; Diffraction; Diffraction gratings; Friction; Gratings; Light sources; Microelectronics; Robustness; Moore fringe; arranged matrix of slit photoelectric cell; contrast degree; incremental;
Conference_Titel :
Optoelectronics and Microelectronics (ICOM), 2012 International Conference on
Conference_Location :
Changchun, Jilin
Print_ISBN :
978-1-4673-2638-4
DOI :
10.1109/ICoOM.2012.6316264