DocumentCode :
3492139
Title :
A self-healing real-time system based on run-time self-reconfiguration
Author :
Gericota, Manuel G. ; Alves, Gustavo R. ; Ferreira, José M.
Author_Institution :
Dept. of Electr. Eng., ISEP, Porto
Volume :
1
fYear :
2005
fDate :
19-22 Sept. 2005
Lastpage :
1042
Abstract :
The new generations of SRAM-based FPGA (field programmable gate array) devices are the preferred choice for the implementation of reconfigurable computing platforms intended to accelerate processing in real-time systems. However, FPGA´s vulnerability to hard and soft errors is a major weakness to robust configurable system design. In this paper, a novel built-in self-healing (BISH) methodology, based on run-time self-reconfiguration, is proposed. A soft microprocessor core implemented in the FPGA is responsible for the management and execution of all the BISH procedures. Fault detection and diagnosis is followed by repairing actions, taking advantage of the dynamic reconfiguration features offered by new FPGA families. Meanwhile, modular redundancy assures that the system still works correctly
Keywords :
SRAM chips; built-in self test; fault location; field programmable gate arrays; microprocessor chips; real-time systems; BISH real-time system; SRAM-based FPGA; built-in self-healing; fault detection; fault diagnosis; field programmable gate array; run-time self-reconfiguration; soft microprocessor; static random access memory; Acceleration; Electromigration; Fault detection; Field programmable gate arrays; Manufacturing; Microprocessors; Real time systems; Robustness; Space technology; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Emerging Technologies and Factory Automation, 2005. ETFA 2005. 10th IEEE Conference on
Conference_Location :
Catania
Print_ISBN :
0-7803-9401-1
Type :
conf
DOI :
10.1109/ETFA.2005.1612638
Filename :
1612638
Link To Document :
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