DocumentCode :
349218
Title :
Property-based testability analysis for hierarchical RTL designs
Author :
Makris, Yiorgos ; Orailoglu, A.
Author_Institution :
Dept. of Comput. Sci. & Eng., California Univ., San Diego, La Jolla, CA
Volume :
2
fYear :
1999
fDate :
5-8 Sep 1999
Firstpage :
1089
Abstract :
We present an analysis methodology that identifies testability bottlenecks in RTL designs, based on the concept of transparency properties. We discuss a hierarchical test generation methodology, wherein test is locally generated for each module and subsequently translated into global design applicable test. We introduce the notion of transparency properties for capturing test translation related behavior of modules, without reasoning on the complete functionality of the design. A recursive search algorithm that combines properties into test justification and propagation paths and reveals the reachability bottlenecks for each module in the design is subsequently devised. An ATPG-based experimental setup validates that the proposed methodology identifies accurately the test translation bottlenecks in the hierarchical design
Keywords :
automatic test pattern generation; integrated circuit testing; logic testing; recursive estimation; search problems; ATPG; RTL designs; functionality; global design; hierarchical RTL designs; hierarchical design; hierarchical test generation; property-based testability analysis; reachability bottlenecks; recursive search algorithm; test justification; test translation; testability bottlenecks; transparency; Algorithm design and analysis; Circuit faults; Circuit testing; Design for testability; Electronic design automation and methodology; Information analysis; Logic design; Logic testing; Signal generators; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics, Circuits and Systems, 1999. Proceedings of ICECS '99. The 6th IEEE International Conference on
Conference_Location :
Pafos
Print_ISBN :
0-7803-5682-9
Type :
conf
DOI :
10.1109/ICECS.1999.813423
Filename :
813423
Link To Document :
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