Multifrequency measurement system for optimising the performance of nonlinear microwave devices

Author

Lê, Di-Luân ; Ghannouchi, Fadhel M.

Author_Institution

Dept. of Electr. & Comput. Eng., Montreal Polytech. Sch., Que., Canada

Volume

2

fYear

1995

fDate

5-8 Sep 1995

Firstpage

1011

Abstract

A test bench has been designed and assembled for experimental study of the electrical behaviour of nonlinear active devices operating under multichromatic excitation. Based on the use of two six-port reflectometers, it can synthesize simultaneously five source and load impedances seen by the device under test. Two-tone measurements performed on an NE 9001 transistor operated in resistive mixer mode show that the linearity of the mixer can be improved by choice of appropriate termination impedances

Keywords

active networks; electric impedance; measurement systems; microwave measurement; microwave mixers; microwave transistors; nonlinear network analysis; optimisation; semiconductor device testing; test equipment; NE 9001 transistor; device under test; electrical behaviour; linearity; load impedances; multichromatic excitation; multifrequency measurement system; nonlinear active devices; nonlinear microwave devices; performance; resistive mixer mode; six-port reflectometers; source impedances; termination impedances; test bench; two-tone measurements; Assembly; Circuit testing; Content addressable storage; DH-HEMTs; Impedance; RF signals; Radio frequency;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical and Computer Engineering, 1995. Canadian Conference on

Conference_Location

Montreal, Que.

ISSN

0840-7789

Print_ISBN

0-7803-2766-7

Type

conf

DOI

10.1109/CCECE.1995.526600

Filename

526600