Title :
Multifrequency measurement system for optimising the performance of nonlinear microwave devices
Author :
Lê, Di-Luân ; Ghannouchi, Fadhel M.
Author_Institution :
Dept. of Electr. & Comput. Eng., Montreal Polytech. Sch., Que., Canada
Abstract :
A test bench has been designed and assembled for experimental study of the electrical behaviour of nonlinear active devices operating under multichromatic excitation. Based on the use of two six-port reflectometers, it can synthesize simultaneously five source and load impedances seen by the device under test. Two-tone measurements performed on an NE 9001 transistor operated in resistive mixer mode show that the linearity of the mixer can be improved by choice of appropriate termination impedances
Keywords :
active networks; electric impedance; measurement systems; microwave measurement; microwave mixers; microwave transistors; nonlinear network analysis; optimisation; semiconductor device testing; test equipment; NE 9001 transistor; device under test; electrical behaviour; linearity; load impedances; multichromatic excitation; multifrequency measurement system; nonlinear active devices; nonlinear microwave devices; performance; resistive mixer mode; six-port reflectometers; source impedances; termination impedances; test bench; two-tone measurements; Assembly; Circuit testing; Content addressable storage; DH-HEMTs; Impedance; RF signals; Radio frequency;
Conference_Titel :
Electrical and Computer Engineering, 1995. Canadian Conference on
Conference_Location :
Montreal, Que.
Print_ISBN :
0-7803-2766-7
DOI :
10.1109/CCECE.1995.526600
