DocumentCode
3492810
Title
An Improved KNN Algorithm of Intelligent Built-in Test
Author
Dongchao, Ji ; Bifeng, Song ; Fei, Han
Author_Institution
Northwestern Polytech. Univ., Xian
fYear
2008
fDate
6-8 April 2008
Firstpage
442
Lastpage
445
Abstract
Aimed at the faults of K-nearest neighbor (KNN) algorithm in complex equipment´s built-in test (BIT), an improved KNN (IKNN) algorithm is proposed to solve the problem from two aspects. Firstly, the weight of each input feature is learned using neural network to make important features contribute more in the classifications; this improves the precision of classification. Secondly, clustering each sample of the training set to reduce the data volume of training set, this improves the running speed of the algorithm. Simulation experiments prove the effectiveness of the IKNN algorithm with higher precision and less calculation.
Keywords
built-in self test; learning (artificial intelligence); neural nets; pattern classification; K-nearest neighbor algorithm; classification precision; intelligent built-in test; neural network; training set; weight learning; Automatic testing; Built-in self-test; Clustering algorithms; Embedded software; Hardware; Multidimensional systems; Neural networks; Software algorithms; Software testing; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Networking, Sensing and Control, 2008. ICNSC 2008. IEEE International Conference on
Conference_Location
Sanya
Print_ISBN
978-1-4244-1685-1
Electronic_ISBN
978-1-4244-1686-8
Type
conf
DOI
10.1109/ICNSC.2008.4525257
Filename
4525257
Link To Document