• DocumentCode
    3492810
  • Title

    An Improved KNN Algorithm of Intelligent Built-in Test

  • Author

    Dongchao, Ji ; Bifeng, Song ; Fei, Han

  • Author_Institution
    Northwestern Polytech. Univ., Xian
  • fYear
    2008
  • fDate
    6-8 April 2008
  • Firstpage
    442
  • Lastpage
    445
  • Abstract
    Aimed at the faults of K-nearest neighbor (KNN) algorithm in complex equipment´s built-in test (BIT), an improved KNN (IKNN) algorithm is proposed to solve the problem from two aspects. Firstly, the weight of each input feature is learned using neural network to make important features contribute more in the classifications; this improves the precision of classification. Secondly, clustering each sample of the training set to reduce the data volume of training set, this improves the running speed of the algorithm. Simulation experiments prove the effectiveness of the IKNN algorithm with higher precision and less calculation.
  • Keywords
    built-in self test; learning (artificial intelligence); neural nets; pattern classification; K-nearest neighbor algorithm; classification precision; intelligent built-in test; neural network; training set; weight learning; Automatic testing; Built-in self-test; Clustering algorithms; Embedded software; Hardware; Multidimensional systems; Neural networks; Software algorithms; Software testing; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Networking, Sensing and Control, 2008. ICNSC 2008. IEEE International Conference on
  • Conference_Location
    Sanya
  • Print_ISBN
    978-1-4244-1685-1
  • Electronic_ISBN
    978-1-4244-1686-8
  • Type

    conf

  • DOI
    10.1109/ICNSC.2008.4525257
  • Filename
    4525257