• DocumentCode
    3493046
  • Title

    Temperature effects on crosstalk in carbon nanotube interconnects

  • Author

    Jia, Lei ; Yin, Wen-Yan

  • Author_Institution
    Center for Microwave & RF Technol., Shanghai Jiao Tong Univ., Shanghai
  • fYear
    2008
  • fDate
    16-20 Dec. 2008
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In this paper, the authors propose two modified temperature-dependent equivalent circuit models for single- and double-walled carbon nanotube (SWCNT & DWCNT) interconnects at first, and the temperature effect on crosstalk in SWCNT and DWCNT interconnects are investigated, respectively. The crosstalk-induced delay and noise of these novel interconnects are characterized numerically over a temperature range from 300 to 600K. The simulation results show that the crosstalk-induced delay increases significantly and the noise increases slightly while the temperature is raised, which indicate that the performance and reliability degrade with an increase in CNT interconnects temperature.
  • Keywords
    carbon nanotubes; delays; integrated circuit interconnections; integrated circuit noise; carbon nanotube interconnect crosstalk; crosstalk induced delay; equivalent circuit model; temperature 300 K to 600 K; temperature effects; Capacitance; Carbon nanotubes; Contact resistance; Crosstalk; Electrostatics; Equivalent circuits; Inductance; Integrated circuit interconnections; Optical scattering; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 2008. APMC 2008. Asia-Pacific
  • Conference_Location
    Macau
  • Print_ISBN
    978-1-4244-2641-6
  • Electronic_ISBN
    978-1-4244-2642-3
  • Type

    conf

  • DOI
    10.1109/APMC.2008.4958645
  • Filename
    4958645