DocumentCode
3493046
Title
Temperature effects on crosstalk in carbon nanotube interconnects
Author
Jia, Lei ; Yin, Wen-Yan
Author_Institution
Center for Microwave & RF Technol., Shanghai Jiao Tong Univ., Shanghai
fYear
2008
fDate
16-20 Dec. 2008
Firstpage
1
Lastpage
4
Abstract
In this paper, the authors propose two modified temperature-dependent equivalent circuit models for single- and double-walled carbon nanotube (SWCNT & DWCNT) interconnects at first, and the temperature effect on crosstalk in SWCNT and DWCNT interconnects are investigated, respectively. The crosstalk-induced delay and noise of these novel interconnects are characterized numerically over a temperature range from 300 to 600K. The simulation results show that the crosstalk-induced delay increases significantly and the noise increases slightly while the temperature is raised, which indicate that the performance and reliability degrade with an increase in CNT interconnects temperature.
Keywords
carbon nanotubes; delays; integrated circuit interconnections; integrated circuit noise; carbon nanotube interconnect crosstalk; crosstalk induced delay; equivalent circuit model; temperature 300 K to 600 K; temperature effects; Capacitance; Carbon nanotubes; Contact resistance; Crosstalk; Electrostatics; Equivalent circuits; Inductance; Integrated circuit interconnections; Optical scattering; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference, 2008. APMC 2008. Asia-Pacific
Conference_Location
Macau
Print_ISBN
978-1-4244-2641-6
Electronic_ISBN
978-1-4244-2642-3
Type
conf
DOI
10.1109/APMC.2008.4958645
Filename
4958645
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