• DocumentCode
    3493081
  • Title

    Susceptibility analysis of wiring harness in a reverberation chamber environment

  • Author

    Bellan, Diego ; Pignari, Sergio

  • Author_Institution
    Dipt. di Elettrotecnica, Politecnico di Milano, Italy
  • Volume
    2
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    746
  • Abstract
    In this work, the external susceptibility of a wiring harness in a reverberation chamber is investigated, and described from a statistical viewpoint. The electromagnetic field generated in the chamber environment is modeled as an integral of plane waves with random amplitude, phase and polarization. The wiring harness is modeled as a uniform and lossless multiconductor transmission line (MTL) with resistive loads. Closed form expressions are derived for statistical estimators (mean value, variance, and probability density function) of the circuit quantities (current, voltage, and power) induced by the impinging field in the line loads. Results obtained in this work for the susceptibility of a MTL in a reverberation chamber are in agreement, and extend the general properties derived in previous works
  • Keywords
    electric connectors; electromagnetic compatibility; electromagnetic fields; electromagnetic interference; multiconductor transmission lines; reverberation chambers; statistical analysis; wiring; EMC; EMI; closed form expressions; electromagnetic field; external susceptibility analysis; plane waves; probability density function; resistive loads; reverberation chamber environment; statistical estimators; susceptibility analysis; uniform lossless multiconductor transmission line; wiring harness; Circuits; Electromagnetic fields; Electromagnetic modeling; Electromagnetic wave polarization; Multiconductor transmission lines; Probability density function; Propagation losses; Reverberation chamber; Voltage; Wiring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2001. EMC. 2001 IEEE International Symposium on
  • Conference_Location
    Montreal, Que.
  • Print_ISBN
    0-7803-6569-0
  • Type

    conf

  • DOI
    10.1109/ISEMC.2001.950467
  • Filename
    950467