DocumentCode :
3493111
Title :
Fast bilinear extrapolation of 3D ising field partition function. application to fMRI image analysis.
Author :
Risser, Laurent ; Idier, Jérôme ; Ciuciu, Philippe ; Vincent, Thomas
Author_Institution :
CNRS, IRCCyN, Nantes, France
fYear :
2009
fDate :
7-10 Nov. 2009
Firstpage :
833
Lastpage :
836
Abstract :
Symmetric ising models define the simplest discrete Markov random fields that can be used for segmentation purpose. Unsupervised segmentation requires an automatic setting of the temperature parameter of ising fields. To this end, partition function (PF) estimation becomes a key issue. In this paper, we present a bilinear extrapolation technique for a fast PF estimation of 3D ising field. The proposed method is a two-step procedure that applies to the context where multiple 3D ising fields are involved over different objects (eg, brain regions) of different size and topology. First, a small set of reference PFs is accurately estimated using path sampling. Second, the large remaining set of PFs is computed using a temperature-dependent bilinear extrapolation technique. It is shown that our approach is accurate and computationally efficient to account for topological fluctuations of ising fields on regular and irregular graphs. A convincing application to joint detection-estimation of brain activity in functional MRI is also presented.
Keywords :
Markov processes; biomedical MRI; extrapolation; graph theory; image sampling; image segmentation; medical image processing; 3D ising field partition function; discrete Markov random fields; fMRI image analysis; irregular graphs; joint detection estimation; partition function estimation; path sampling; regular graphs; symmetric ising models; temperature-dependent bilinear extrapolation technique; unsupervised image segmentation; Brain; Extrapolation; Fluctuations; Image analysis; Image segmentation; Magnetic resonance imaging; Markov random fields; Sampling methods; Temperature; Topology; 3D images; Fast scheme; Ising field; Partition function; Path sampling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Image Processing (ICIP), 2009 16th IEEE International Conference on
Conference_Location :
Cairo
ISSN :
1522-4880
Print_ISBN :
978-1-4244-5653-6
Electronic_ISBN :
1522-4880
Type :
conf
DOI :
10.1109/ICIP.2009.5414366
Filename :
5414366
Link To Document :
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