DocumentCode :
3493194
Title :
Skewness as feature for the diagnosis of Alzheimer´s disease using SPECT images
Author :
Salas-Gonzalez, D. ; Górriz, J.M. ; Ramirez, J. ; Álvarez, I. ; López, M. ; Segovia, F. ; Gómez-Río, M.
Author_Institution :
Dept. Signal Theor., Univ. of Granada, Granada, Spain
fYear :
2009
fDate :
7-10 Nov. 2009
Firstpage :
837
Lastpage :
840
Abstract :
This paper presents a computer-aided diagnosis technique for improving the accuracy of the early diagnosis of the Alzheimer type dementia. The proposed methodology is based on the calculation of the skewness to each m-by-m sliding block of the transaxial slices of the SPECT brain images. We replace the center pixel in the m-by-m block by the skewness value and build a new 3-D brain image which will be used for classification purposes. After that, we select the voxels which present a Welch´s t-statistic between both classes, Normal and Alzheimer images, higher (or lower) than a given threshold. The mean, standard deviation, skewness and kurtosis are calculated for selected voxels and they are chosen as feature vectors for three different classifiers: support vector machines with linear kernel, classification trees and multivariate normal model. The proposed methodology reaches an accuracy higher than 98% in the classification task.
Keywords :
brain; diseases; medical image processing; pattern classification; single photon emission computed tomography; support vector machines; trees (mathematics); Alzheimer disease; SPECT images; brain images; classification trees; classifiers; computer-aided diagnosis; dementia; multivariate normal model; patient diagnosis; skewness; support vector machines; Alzheimer´s disease; Brain; Computer aided diagnosis; Dementia; Image databases; Nuclear medicine; Pixel; Power system modeling; Single photon emission computed tomography; Support vector machines; Alzheimer´s disease; Classification; Computer aided diagnosis; SPECT Brain Imaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Image Processing (ICIP), 2009 16th IEEE International Conference on
Conference_Location :
Cairo
ISSN :
1522-4880
Print_ISBN :
978-1-4244-5653-6
Electronic_ISBN :
1522-4880
Type :
conf
DOI :
10.1109/ICIP.2009.5414369
Filename :
5414369
Link To Document :
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