Title :
Material issues in reliability of optical fiber communication lasers
Author_Institution :
Lucent Technol., Bell Labs., Murray Hill, NJ, USA
Abstract :
Reliability of telecommunication laser diodes at their normal operation conditions is usually estimated by extrapolation of degradation rates obtained at accelerated aging conditions. The statistical method of prediction of the mean lifetime to failure is currently the standard way for qualifying a product as well as its manufacturing process
Keywords :
ageing; life testing; optical testing; optical transmitters; probability; semiconductor device reliability; semiconductor device testing; semiconductor lasers; telecommunication network reliability; accelerated aging test conditions; degradation rates; extrapolation; manufacturing process; mean lifetime to failure prediction; normal operation conditions; optical fiber communication laser reliability; statistical method; telecommunication laser diode reliability; Accelerated aging; Degradation; Fiber lasers; Materials reliability; Optical fiber communication; Optical materials; Statistical analysis; Telecommunications; Testing; Threshold current;
Conference_Titel :
LEOS '99. IEEE Lasers and Electro-Optics Society 1999 12th Annual Meeting
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-5634-9
DOI :
10.1109/LEOS.1999.813546
