• DocumentCode
    3493638
  • Title

    Current generator for testing power semiconductor devices in high conduction state

  • Author

    Bespalov, N.N. ; Ilyin, M.V. ; Kapitonov, S.S.

  • Author_Institution
    N.P. Ogarev Res.-Eng. Center Radio-Eng. Instrum., Mordovian State Univ., Saransk, Russia
  • fYear
    2012
  • fDate
    2-4 Oct. 2012
  • Firstpage
    143
  • Lastpage
    146
  • Abstract
    Paper describes current generator for testing power semiconductor devices in high conduction state. Modeling of generator operation is performed by Multisim software. Advantages of the generator are discussed.
  • Keywords
    power semiconductor devices; semiconductor device testing; Multisim software; current generator; high conduction state; power semiconductor devices testing; Educational institutions; Electronic mail; Generators; Instruments; Power semiconductor devices; TV; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Actual Problems of Electronics Instrument Engineering (APEIE), 2012 11th International Conference on
  • Conference_Location
    Novosibirsk
  • Print_ISBN
    978-1-4673-2842-5
  • Type

    conf

  • DOI
    10.1109/APEIE.2012.6629090
  • Filename
    6629090
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3493638