Design-in for EMC on CMOS large-scale integrated circuits

Author

Steinecke, T.

Author_Institution

Infineon Technol. AG, Munich, Germany

Volume

2

fYear

2001

fDate

2001

Firstpage

910

Abstract

Meeting EMC demands is today and in future crucial to survive in the automotive, wireless and telecommunications market. This is valid not only for the system application level, but to a high grade already for semiconductor manufacturers. Testchips have been developed and evaluated at Infineon Technologies, reported previously by the author (2000). Research on signal integrity and RF noise decoupling inside the chips continues. This paper presents a set of design circuits and measures to improve EMC on silicon. The range is from RC low-pass noise filtering to improved I/O driver and clock distribution concepts. These measures have already been implemented in commercial products. Test results are shown from direct on-chip measurements and normative-compliant external emission measurements

Keywords

CMOS integrated circuits; VLSI; clocks; electric current measurement; electric noise measurement; electromagnetic compatibility; electromagnetic interference; integrated circuit design; integrated circuit testing; low-pass filters; CMOS large-scale integrated circuits; EMC; EMC improvement; EMI; I/O driver; RC low-pass noise filtering; RF current measurement; RF noise decoupling; VLSI; automotive market; clock distribution; conducted emission measurement; design circuits; direct on-chip measurements; electromagnetic emission behaviour; normative-compliant external emission measurements; semiconductor manufacturers; signal integrity; system application level; telecommunications market; test chips; wireless market; Automotive engineering; CMOS integrated circuits; CMOS technology; Circuit noise; Circuit testing; Electromagnetic compatibility; Large scale integration; Semiconductor device manufacture; Semiconductor device measurement; Semiconductor device noise;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility, 2001. EMC. 2001 IEEE International Symposium on

Conference_Location

Montreal, Que.

Print_ISBN

0-7803-6569-0

Type

conf

DOI

10.1109/ISEMC.2001.950505

Filename

950505