Title :
Conducted susceptibility diagnosis of vehicle electronic circuit using mixed-mode S-parameter method
Author :
Ho, C.-Y. ; Huang, C.-H. ; Horng, T.S. ; Lin, K.-H. ; Liao, S.-Y. ; Huang, L.-F. ; Lee, H.-C. ; Chung, H.-H. ; Chien, C.-C.
Author_Institution :
Dept. of Electr. Eng., Nat. Sun Yat-Sen Univ., Kaohsiung
Abstract :
In this paper, the conducted susceptibility of vehicle electronic circuit to external common- mode disturbances was studied using the mixed-mode S-parameters method. The proposed method uses the common-to-differential mode conversion to account for conducted susceptibility. According to the experimental results, the correlation between the BCI test and the mixed-mode S-parameters method is in good agreement for predicting the immunity weakness.
Keywords :
S-parameters; automotive electronics; common-to-differential mode conversion; conducted susceptibility diagnosis; external common-mode disturbances; mixed-mode S-parameter method; vehicle electronic circuit; Capacitors; Circuit testing; Control systems; Delta modulation; Electromagnetic compatibility; Electronic circuits; Immune system; Immunity testing; Scattering parameters; Vehicles;
Conference_Titel :
Microwave Conference, 2008. APMC 2008. Asia-Pacific
Conference_Location :
Macau
Print_ISBN :
978-1-4244-2641-6
Electronic_ISBN :
978-1-4244-2642-3
DOI :
10.1109/APMC.2008.4958680