DocumentCode :
3494164
Title :
Instrumentation and associated uncertainty for measuring EMI disturbances above 1 GHz
Author :
Bronaugh, Edwin L.
Author_Institution :
EdB EMC Consultants, Austin, TX, USA
Volume :
2
fYear :
2001
fDate :
2001
Firstpage :
980
Abstract :
Measurements may be made above 1 GHz using either spectrum-analyzer-based instrumentation or receiver-based instrumentation. The instrumentation configurations are described and shown in sketches indicating the needed ancillary equipment for either basis of measurement instrumentation. The problems associated with each instrumentation basis are discussed. The discussion is related to what is being measured and the type of facility in which it is being measured. The advantages and disadvantages of several types of antennas are mentioned. Several types of test facilities are compared, and interactions between the antennas and test facilities are included. All of this is related to what must be measured, e.g., FCC requirements, the sensitivity needed and how to avoid measurement problems, such as instrument overload. Suggestions are given for optimum application of instrumentation, including antennas and test facilities. The uncertainty of the measurement instrumentation and facilities is explored, and typical expanded uncertainties are given
Keywords :
electric field measurement; electric noise measurement; electromagnetic interference; instrumentation; magnetic field measurement; measurement uncertainty; spectral analysers; test facilities; 1 to 18 GHz; EMC measurement; EMI disturbances measurement uncertainty; FCC requirements; ancillary equipment; antennas; instrument overload; receiver-based instrumentation; sensitivity; spectrum-analyzer-based instrumentation; test facilities; Antenna measurements; Bandwidth; Distortion measurement; Electromagnetic compatibility; Electromagnetic interference; Instruments; Measurement uncertainty; Preamplifiers; Spectral analysis; Test facilities;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 2001. EMC. 2001 IEEE International Symposium on
Conference_Location :
Montreal, Que.
Print_ISBN :
0-7803-6569-0
Type :
conf
DOI :
10.1109/ISEMC.2001.950527
Filename :
950527
Link To Document :
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