• DocumentCode
    349437
  • Title

    Effects of O ion dose on the formation of copper oxide nanoparticles in silica glasses by implantation with high-energy Cu and O ions

  • Author

    Nakao, Satomi ; Ikeyama, Masami ; Tazawa, Masato ; Jin, Ping ; Niwa, Hiroaki ; Tanemura, Seita ; Miyagawa, Yoshiko ; Miyagawa, Soji ; Saitoh, Kazuo

  • Author_Institution
    Nat. Ind. Res. Inst. of Nagoya, Japan
  • Volume
    2
  • fYear
    1999
  • fDate
    36495
  • Firstpage
    771
  • Abstract
    Implantation into silica glasses with O and Cu ions and subsequently thermal annealing in vacuum were carried out, and the optical and structural changes were examined as a function of O ion dose by optical absorption and thin film X-ray diffraction measurements. In the Cu implantation alone, Cu nanoparticles were formed in the silica glasses after annealing at 800-1000°C. On the other hand, co-implantation of O and Cu ions suppressed the growth of Cu nanoparticles, and promoted the formation of Cu2O nanoparticles. Further increase in the O ion dose led to the formation of CuO nanoparticles as well as Cu2O nanoparticles
  • Keywords
    X-ray diffraction; annealing; copper compounds; ion implantation; nanostructured materials; semiconductor doped glasses; surface plasmon resonance; visible spectra; 800 to 1000 degC; CuO-SiO2; O ion dose; X-ray diffraction; ion implantation; nanoparticles; optical absorption; silica glasses; thermal annealing; Annealing; Copper; Electromagnetic wave absorption; Glass; Nanoparticles; Optical diffraction; Optical films; Particle beam optics; Silicon compounds; X-ray diffraction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ion Implantation Technology Proceedings, 1998 International Conference on
  • Conference_Location
    Kyoto
  • Print_ISBN
    0-7803-4538-X
  • Type

    conf

  • DOI
    10.1109/IIT.1998.813781
  • Filename
    813781