DocumentCode
3494370
Title
High field domain formation and current-voltage hysteresis in selectively doped GaAs/AlGaAs multiple-quantum-well structures
Author
Yoon, S.F. ; Radhakrishnan, Krishnaja ; Zhang, D.H. ; Han, Z.Y.
Author_Institution
Sch. of Electr. & Electron. Eng., Nanyang Technol. Inst., Singapore
fYear
1996
fDate
26-28 Nov 1996
Firstpage
158
Lastpage
163
Abstract
We have studied the sequential tunneling of electrons in selectively doped GaAs/AlGaAs tight-binding multiple-quantum-wells (MQWs) using two structures with different doping profiles, one with Si doping in the AlGaAs barriers and other, with Si doping in the GaAs wells. In both the cases, the current-voltage (I-V) measurements showed two series of current oscillations which persisted up 200 K. The I-V characteristics also showed a hysteresis effect at increasing and decreasing voltage sweep. The voltage separations between the adjacent current oscillations in the I-V characteristics of the structures with ohmic and Schottky contact metallization give a good measure of the energy difference between the excited states and the ground state in the quantum-well, with good agreement with theoretical calculations. The process of sequential electron tunneling through the MQW structures is discussed in terms of the creation and extension of high-field domains (HFDs) due to the applied bias
Keywords
III-V semiconductors; aluminium compounds; current fluctuations; doping profiles; electron-phonon interactions; excited states; gallium arsenide; ground states; high field effects; hysteresis; semiconductor doping; semiconductor quantum wells; tunnelling; 5 to 200 K; GaAs-AlGaAs:Si; GaAs:Si-AlGaAs; I-V characteristics hysteresis; Schottky contact metallization; Si doping; current oscillations; current-voltage measurements; doping profiles; energy difference; excited states; ground state; high field domain formation; ohmic contact metallization; phonon scattering miniband broadening; selectively doped GaAs/AlGaAs multiple-quantum-well structures; sequential electron tunneling; voltage separations; voltage sweep; Current measurement; Doping profiles; Electrons; Gallium arsenide; Hysteresis; Metallization; Quantum well devices; Schottky barriers; Tunneling; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Electronics, 1996. ICSE '96. Proceedings., 1996 IEEE International Conference on
Conference_Location
Penang
Print_ISBN
0-7803-3388-8
Type
conf
DOI
10.1109/SMELEC.1996.616474
Filename
616474
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