DocumentCode :
349440
Title :
Conversion electron Mossbauer spectroscopy (CEMS) and X-ray diffraction studies of 40 keV He-irradiated SUS304 austenitic stainless steel
Author :
Toriyama, T. ; Ishibashi, T. ; Hayashi, N. ; Sakamoto, I. ; Nishio, K. ; Wakabayashi, H. ; Iijima, H.
Author_Institution :
Atomic Energy Eng., Musashi Inst. of Technol., Tokyo, Japan
Volume :
2
fYear :
1999
fDate :
36495
Firstpage :
783
Abstract :
In order to elucidate the martensitic transformation process induced by He gas accumulated in SUS304 austenitic stainless steel, the relationship between the hyperfine parameters for the austenitic phase and the induced martensitic phase and He-ion fluence for He-irradiated steel samples was investigated using Conversion Electron Mossbauer Spectroscopy. The changes of lattice constant for austenitic and induced martensitic phases were also investigated using X-ray diffraction. The samples were irradiated by 40 keV He ions at fluences of 3.6×10 17, 7.2×1017 and 10.8×1017 ions/cm2 at a temperature of 70°C. We have found that the hyperfine field and lattice constant of the induced martensitic phase are both slightly larger than those for the martensitic phase formed by rolling. An austenitic phase modified by He irradiation has also been formed; the lattice constant of the modified austenitic phase is by about 0.5% larger than that of unirradiated austenitic phase, which may suggest the formation of a precursor preceding the martensitic transformation induced by He bubbles
Keywords :
Mossbauer effect; austenitic stainless steel; bubbles; conversion electron spectra; hyperfine interactions; ion beam effects; martensitic transformations; 40 keV; 70 degC; He bubbles; He-ion fluence; He-irradiated steel samples; SUS304 austenitic stainless steel; X-ray diffraction; austenitic phase; conversion electron Mossbauer spectroscopy; hyperfine field; induced martensitic phase; lattice constant; martensitic transformation; Electrons; Helium; Iron; Lattices; Magnetic materials; Neutrons; Steel; Superconducting materials; Temperature; X-ray diffraction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ion Implantation Technology Proceedings, 1998 International Conference on
Conference_Location :
Kyoto
Print_ISBN :
0-7803-4538-X
Type :
conf
DOI :
10.1109/IIT.1998.813784
Filename :
813784
Link To Document :
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