Title :
Segmentation on surfaces with the Closest Point Method
Author :
Tian, Li Luke ; Macdonald, Colin B. ; Ruuth, Steven J.
Author_Institution :
Dept. of Math., Simon Fraser Univ., Burnaby, BC, Canada
Abstract :
We propose a method to detect objects and patterns in textures on general surfaces. Our approach applies the Chan-Vese variational model for active contours without edges to the problem of segmentation of scalar surface data. This leads to gradient descent equations which are level set equations on surfaces. These equations are evolved using the closest point method, which is a technique for solving partial differential equations (PDEs) on surfaces. The final algorithm has a particularly simple form: it merely alternates a time step of the usual Chan-Vese model in a small 3D neighborhood of the surface with an interpolation step. We remark that the method can treat very general surfaces since it uses a closest point function to represent the underlying surface. Various experimental results are presented, including segmentation on smooth surfaces, non-smooth surfaces, open surfaces, and general triangulated surfaces.
Keywords :
gradient methods; image segmentation; image texture; interpolation; object detection; partial differential equations; variational techniques; Chan-Vese model; Chan-Vese variational model; active contours; closest point method; general triangulated surface segmentation; gradient descent equation; image segmentation; interpolation step; nonsmooth surface segmentation; numerical analysis; object detection; open surface segmentation; partial differential equation; pattern detection; scalar surface data segmentation; Active contours; Finite element methods; Image segmentation; Interpolation; Level set; Mathematics; Partial differential equations; Surface texture; Surface topography; Surface treatment; Image segmentation; Numerical analysis; Partial differential equations; Surfaces; Variational methods;
Conference_Titel :
Image Processing (ICIP), 2009 16th IEEE International Conference on
Conference_Location :
Cairo
Print_ISBN :
978-1-4244-5653-6
Electronic_ISBN :
1522-4880
DOI :
10.1109/ICIP.2009.5414447