Title :
On the use of three-dimensional TEM cells for total radiated power measurements
Author :
Klingler, Marco ; Egot, Séphane ; Ghys, Jean-Pierre ; Rioult, Jean
Author_Institution :
INRETS-LEOST, Villeneuve d´´Ascq, France
Abstract :
Three-dimensional TEM cells offer new issues in EMC immunity and emission testing, where the question of orienting the object under test is no longer raised. This paper starts by presenting the general concept of 3-D TEM cells and hybrid chambers followed by one of the first applications in measuring the total radiated power of devices under test. After a short background on emission measurements in TEM and GTEM cells, the second part of this paper considers a practical industrial case where the total radiated power of an electronic equipment is measured in a 3-D TEM prototype cell, and the results compared to those of TEM and GTEM cells. Finally, the repeatability and reproducibility between TEM, GTEM and 3-D TEM cells is studied and discussed
Keywords :
electric field measurement; electromagnetic compatibility; electromagnetic interference; electronic equipment testing; magnetic field measurement; test facilities; 3-D TEM cells; EMC immunity testing; GTEM cells; TEM cells; electronic equipment; emission measurements; emission testing; test facilities; three-dimensional TEM cells; total radiated power measurements; Couplings; Electromagnetic measurements; Electronic equipment; Frequency; Immunity testing; Open area test sites; Power measurement; Prototypes; TEM cells; Test facilities;
Conference_Titel :
Electromagnetic Compatibility, 2001. EMC. 2001 IEEE International Symposium on
Conference_Location :
Montreal, Que.
Print_ISBN :
0-7803-6569-0
DOI :
10.1109/ISEMC.2001.950561