DocumentCode :
3494865
Title :
Enhancement of mechanical Q for low phase noise optomechanical oscillators
Author :
Rocheleau, Tristan O. ; Grine, Alejandro J. ; Grutter, Karen E. ; Schneider, Robert A. ; Quack, Niels ; Wu, Ming C. ; Nguyen, Clark T.-C
Author_Institution :
Univ. of California, Berkeley, Berkeley, CA, USA
fYear :
2013
fDate :
20-24 Jan. 2013
Firstpage :
118
Lastpage :
121
Abstract :
A self-sustained Radiation-Pressure driven MEMS ring OptoMechanical Oscillator (RP-OMO) attaining an anchor-loss-limited mechanical Q-factor of 10,400 in vacuum has posted a best-to-date phase noise of -102 dBc/Hz at a 1 kHz offset from a 74 MHz carrier, more than 15 dB better than the best previously published mark [1]. While enhanced optical and mechanical Q both serve to lower the optical threshold power required to obtain oscillation, it is the mechanical Q that ends up having the strongest impact on phase noise [2], much as in a traditional MEMS-based oscillator [3]. This motivates a focus on increased mechanical Q-a challenge in previous such devices measured in air-and requires measurement in the absence of gas-damping using a custom optical vacuum measurement system. The improved phase noise performance of these RP-OMOs is now on par with many conventional MEMS-based oscillators and is sufficient for the targeted chip-scale atomic clock application.
Keywords :
Q-factor; micro-optomechanical devices; microsensors; optical variables measurement; oscillators; phase noise; vacuum measurement; RP-OMO; anchor-loss-limited mechanical Q-factor; custom optical vacuum measurement system; frequency 74 MHz; gas-damping; improved phase noise performance; low phase noise optomechanical oscillators; mechanical Q-factor enhancement; optical threshold power; self-sustained radiation-pressure driven MEMS ring optomechanical oscillator; targeted chip-scale atomic clock application; Nonlinear optics; Optical feedback; Optical pumping; Optical resonators; Optical variables measurement; Phase noise;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Micro Electro Mechanical Systems (MEMS), 2013 IEEE 26th International Conference on
Conference_Location :
Taipei
ISSN :
1084-6999
Print_ISBN :
978-1-4673-5654-1
Type :
conf
DOI :
10.1109/MEMSYS.2013.6474191
Filename :
6474191
Link To Document :
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