Title :
Analysis of EMI effects in Op-Amp ICs: measurement techniques and numerical prediction
Author :
Florean, D. ; Marchiori, F. ; Pinelli, I.M. ; Tomasin, I.P.
Author_Institution :
Dipt. di Elettronica e Inf., Padova Univ., Italy
Abstract :
When electromagnetic interference (EMI) couples with the pins of an integrated circuit (IC) it can cause operation variation due to the rectification, which implies a modification of the bias point. This work presents a further development of the methodology for the extensive valuation of the EMI effects in analog IC presented previously by D. Florean et al. (2000), taking as an example the case of several different operational amplifiers (Op-Amps) and a wider range of noise in terms of frequency and amplitude. Moreover the EMI effects on the test IC are predicted with the utilisation of common circuit simulator SPICE, with interesting results
Keywords :
SPICE; electromagnetic coupling; electromagnetic interference; integrated circuit testing; operational amplifiers; EMI; EMI effects; Op-Amp IC; SPICE; bias point modifications; electromagnetic interference; integrated circuit; measurement techniques; numerical prediction; operational amplifiers; rectification; test IC prediction; Analog integrated circuits; Circuit testing; Cost accounting; Coupling circuits; Electromagnetic coupling; Electromagnetic interference; Integrated circuit noise; Measurement techniques; Operational amplifiers; Pins;
Conference_Titel :
Electromagnetic Compatibility, 2001. EMC. 2001 IEEE International Symposium on
Conference_Location :
Montreal, Que.
Print_ISBN :
0-7803-6569-0
DOI :
10.1109/ISEMC.2001.950570
