DocumentCode :
3495350
Title :
Performance assessment of mammography image segmentation algorithms
Author :
Byrd, Kenneth ; Zeng, Jianchao ; Chouikha, Mohamed
Author_Institution :
Center for Appl. High Performance Comput., Howard Univ., Washington, DC
fYear :
2005
fDate :
1-1 Dec. 2005
Lastpage :
157
Abstract :
In this paper, we present a comprehensive validation analysis to evaluate the performance of three existing mammogram segmentation algorithms against manual segmentation results produced by two expert radiologists. These studies are especially important for the development of computer-aided cancer detection (CAD) systems, which will significantly help improve early detection of breast cancer. Three typical segmentation methods were implemented and applied to 50 malignant mammography images chosen from the University of South Florida´s Digital Database for Screening Mammography (DDSM): (a) region growing combined with maximum likelihood modeling (Kinnard model), (b) an active deformable contour model (snake model), and (c) a standard potential field model (standard model). A comprehensive statistical validation protocol was applied to evaluate the computer and expert outlined segmentation results; both sets of results were examined from the inter- and intra-observer points of view. Experimental results are presented and discussed in this communication
Keywords :
cancer; diagnostic radiography; image segmentation; mammography; medical image processing; statistical analysis; CAD systems; Kinnard model; active deformable contour model; breast cancer detection; computer-aided cancer detection; image segmentation; malignant mammography images; mammogram segmentation; maximum likelihood modeling; performance assessment; potential field model; snake model; standard model; statistical validation; Algorithm design and analysis; Breast cancer; Cancer detection; Deformable models; Delta-sigma modulation; Image databases; Image segmentation; Mammography; Maximum likelihood detection; Performance analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applied Imagery and Pattern Recognition Workshop, 2005. Proceedings. 34th
Conference_Location :
Washington, DC
ISSN :
1550-5219
Print_ISBN :
0-7695-2479-6
Type :
conf
DOI :
10.1109/AIPR.2005.39
Filename :
1612816
Link To Document :
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