DocumentCode
349541
Title
Monte Carlo simulation of surface smoothing effect by cluster ions
Author
Hagiwara, Norihisa ; Toyoda, Noriaki ; Matsuo, Jiro ; Yamada, Isao
Author_Institution
Ion Beam Eng. Exp. Lab., Kyoto Univ., Japan
Volume
2
fYear
1999
fDate
36495
Firstpage
1230
Abstract
Cluster ion beam exhibits surface smoothing effects even for a very hard material such as diamond and TiN. From the experimental studies, it was found that the sputtering effects with cluster ions are completely different from those with monomer ions. In this work, surface smoothing mechanisms with cluster ions are studied with Monte Carlo simulations. The motions of the atoms in the cluster-ion impact were modeled and Monte Carlo simulations were performed. Since the ejected atoms move only a few nm by one cluster ion impact, the hills and valleys with high spatial frequencies are removed preferentially, and those with low spatial frequencies needs more ion doses to planarize
Keywords
Monte Carlo methods; ion-surface impact; sputtering; C; Monte Carlo simulation; TiN; cluster ion beam; cluster-ion impact; diamond; sputtering effects; surface smoothing effect; very hard material; Argon; Frequency; Ion beams; Semiconductor device modeling; Smoothing methods; Sputtering; Superconducting films; Surface cleaning; Surface morphology; Tin;
fLanguage
English
Publisher
ieee
Conference_Titel
Ion Implantation Technology Proceedings, 1998 International Conference on
Conference_Location
Kyoto
Print_ISBN
0-7803-4538-X
Type
conf
DOI
10.1109/IIT.1998.813909
Filename
813909
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