• DocumentCode
    349541
  • Title

    Monte Carlo simulation of surface smoothing effect by cluster ions

  • Author

    Hagiwara, Norihisa ; Toyoda, Noriaki ; Matsuo, Jiro ; Yamada, Isao

  • Author_Institution
    Ion Beam Eng. Exp. Lab., Kyoto Univ., Japan
  • Volume
    2
  • fYear
    1999
  • fDate
    36495
  • Firstpage
    1230
  • Abstract
    Cluster ion beam exhibits surface smoothing effects even for a very hard material such as diamond and TiN. From the experimental studies, it was found that the sputtering effects with cluster ions are completely different from those with monomer ions. In this work, surface smoothing mechanisms with cluster ions are studied with Monte Carlo simulations. The motions of the atoms in the cluster-ion impact were modeled and Monte Carlo simulations were performed. Since the ejected atoms move only a few nm by one cluster ion impact, the hills and valleys with high spatial frequencies are removed preferentially, and those with low spatial frequencies needs more ion doses to planarize
  • Keywords
    Monte Carlo methods; ion-surface impact; sputtering; C; Monte Carlo simulation; TiN; cluster ion beam; cluster-ion impact; diamond; sputtering effects; surface smoothing effect; very hard material; Argon; Frequency; Ion beams; Semiconductor device modeling; Smoothing methods; Sputtering; Superconducting films; Surface cleaning; Surface morphology; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ion Implantation Technology Proceedings, 1998 International Conference on
  • Conference_Location
    Kyoto
  • Print_ISBN
    0-7803-4538-X
  • Type

    conf

  • DOI
    10.1109/IIT.1998.813909
  • Filename
    813909