Title :
A voltage controlled emission model of electromagnetic emission of IC for system analysis
Author :
Kralicek, P. ; John, W. ; De Smedt, R. ; Vervoort, K. ; Garbe, H.
Author_Institution :
Fraunhofer Inst., Paderborn, Germany
Abstract :
In this contribution, a new modeling methodology for the electromagnetic emissions of integrated circuits for system analysis is presented. The developed models are based on a multipole expansion of the electromagnetic field. Using this macro-representation, the number of necessary model parameters can be drastically reduced. In order to account also for the influence of external circuitry, the models have been appropriately extended towards a voltage controlled emission model. To show the applicability of the new approach, a system-level simulator has been enhanced to use the developed models. The simulation results of a complex configuration are compared to reference calculations. Additionally, the high efficiency of this approach, concerning computation time and memory consumption, is described
Keywords :
circuit simulation; electromagnetic compatibility; electromagnetic fields; electromagnetic interference; integrated circuit modelling; printed circuits; computational efficiency; electromagnetic field multipole expansion; integrated circuits electromagnetic emissions modeling methodology; macro-representation; model parameters reduction; system analysis; system-level simulator; voltage controlled emission model; Circuit analysis; Computational modeling; Electromagnetic analysis; Electromagnetic fields; Electromagnetic modeling; Integrated circuit modeling; Integrated circuit packaging; Integrated circuit reliability; Integrated circuit technology; Voltage control;
Conference_Titel :
Electromagnetic Compatibility, 2001. EMC. 2001 IEEE International Symposium on
Conference_Location :
Montreal, Que.
Print_ISBN :
0-7803-6569-0
DOI :
10.1109/ISEMC.2001.950602
