Title :
A new approach for LSB based image steganography using secret key
Author :
Karim, S. M Masud ; Rahman, Md Saifur ; Hossain, Md Ismail
Author_Institution :
Comput. Sci. & Eng. Discipline, Khulna Univ., Khulna, Bangladesh
Abstract :
This paper introduces a best approach for Least Significant Bit (LSB) based on image steganography that enhances the existing LSB substitution techniques to improve the security level of hidden information. It is a new approach to substitute LSB of RGB true color image. The new security conception hides secret information within the LSB of image where a secret key encrypts the hidden information to protect it from unauthorized users. In general, in LSB methods, hidden information is stored into a specific position of LSB of image. For this reason, knowing the retrieval methods, anyone can extract the hidden information. In our paper, hidden information is stored into different position of LSB of image depending on the secret key. As a result, it is difficult to extract the hidden information knowing the retrieval methods. We have used the Peak Signal-to-Noise Ratio (PSNR) to measure the quality of the stego images. The value of PSNR gives better result because our proposed method changes very small number of bits of the image. The obtained results show that the proposed method results in LSB based image steganography using secret key which provides good security issue and PSNR value than general LSB based image steganography methods.
Keywords :
cryptography; image colour analysis; steganography; LSB based image steganography; LSB substitution techniques; PSNR value; RGB true color image; hidden information encryption; hidden information extraction; hidden information security level; least significant bit; peak signal-to-noise ratio; retrieval methods; secret key; stego image quality; LSB; cover-image; steganography; stego-image;
Conference_Titel :
Computer and Information Technology (ICCIT), 2011 14th International Conference on
Conference_Location :
Dhaka
Print_ISBN :
978-1-61284-907-2
DOI :
10.1109/ICCITechn.2011.6164800