Title :
Simultaneous extraction of thermal and emitter series resistances in bipolar transistors
Author :
Tran, H. ; Schröter, M. ; Walkey, D.J. ; Marchesan, D. ; Smy, T.J.
Author_Institution :
Dept. of Electron., Carleton Univ., Ottawa, Ont., Canada
Abstract :
This paper describes a new method for simultaneous extraction of emitter and thermal resistance in bipolar transistors. The approach is verified using data generated by a compact model including self-heating and numerical simulation with lattice heating. Measured results are presented for the emitter and thermal resistances of self-aligned polysilicon devices and SiGe heterojunction devices
Keywords :
bipolar transistors; digital simulation; heterojunction bipolar transistors; semiconductor device models; thermal resistance; Si; SiGe; bipolar transistors; compact model; emitter series resistances; heterojunction devices; lattice heating; numerical simulation; self-aligned polysilicon devices; self-heating; simultaneous extraction; thermal series resistances; Bipolar transistors; Data mining; Electrical resistance measurement; Germanium silicon alloys; Heating; Heterojunctions; Lattices; Numerical simulation; Silicon germanium; Thermal resistance;
Conference_Titel :
Bipolar/BiCMOS Circuits and Technology Meeting, 1997. Proceedings of the
Conference_Location :
Minneapolis, MN
Print_ISBN :
0-7803-3916-9
DOI :
10.1109/BIPOL.1997.647427
