DocumentCode
3496753
Title
Reliability evaluation for specify factor of fatigue on power device
Author
Kobayshi, M. ; Yu, Qiang
Author_Institution
Dept. of Mech. Eng. & Mater. Sci., Yokohama Nat. Univ., Yokohama, Japan
fYear
2010
fDate
12-14 Jan. 2010
Firstpage
1
Lastpage
6
Abstract
This paper presents a fundamental method to evaluate thermal fatigue life of power module. Coupled electrical-thermal analysis is performed to obtain the distribution of temperature due to electric current. Then, thermo-mechanical analysis is carried out to calculate inelastic, aluminum wire bonding was done. Crack path simulation technique was used to evaluate total fatigue life of solder joint and resultant temperature increase. The fatigue life of aluminum wire bonding was estimated by the same model and similar approach. The crack at the center of the solder layer below aluminum wire bonding. The the maximum temperature in the solder grows up of crack propagation. Therefore, the fatigue life of aluminum wire bonding deteriorates. That is to say, this study is comparison between the fatigue life of solder joint and aluminum wire bonding for evaluate total life of the power module.
Keywords
fatigue cracks; lead bonding; power semiconductor devices; reliability; solders; thermal analysis; thermal stress cracking; coupled electrical-thermal analysis; crack path simulation; crack propagation; inelastic aluminum wire bonding; power device; reliability evaluation; solder joint; solder layer; thermal fatigue life; thermomechanical analysis; total fatigue life; Aluminum; Bonding; Couplings; Current; Fatigue; Multichip modules; Performance analysis; Soldering; Temperature distribution; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Prognostics and Health Management Conference, 2010. PHM '10.
Conference_Location
Macao
Print_ISBN
978-1-4244-4756-5
Electronic_ISBN
978-1-4244-4758-9
Type
conf
DOI
10.1109/PHM.2010.5414564
Filename
5414564
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