DocumentCode
3496791
Title
The photocurrent of resonant tunneling diode controlled by the charging effects of quantum dots
Author
Zhou, Daming ; Weng, Qianchun ; Wang, Wangping ; Li, Ning ; Zhang, Bo ; Chen, Xiaoshuang ; Lu, Wei ; Wang, Wenxin ; Chen, Hong
Author_Institution
Nat. Lab. for Infrared Phys., Shanghai Inst. of Tech. Phys., Shanghai, China
fYear
2012
fDate
28-31 Aug. 2012
Firstpage
49
Lastpage
50
Abstract
We experimentally studied the photocurrent of AlAs/GaAs/AlAs double barrier resonant tunneling diode (RTD), which is composed of an InAs layer of self-assembled quantum-dots (QDs) on top of the AlAs barrier layer. It is found that the charging InAs quantum dots can effectively modulate the carrier transport properties of the RTD. Moreover, we also found that the resonant tunneling current through a single energy level of an individual quantum dot is extremely sensitive to the photo-excited holes bound nearby the dot, and the presence of the holes lowers the electrostatic energy of the quantum dot state. In addition, it is also observed that the photocurrent can increase step by step with the individual photon pulse excitation when the illumination is low enough. The experiment results well demonstrated the quantum amplified characteristics of the device.
Keywords
III-V semiconductors; aluminium compounds; gallium arsenide; indium compounds; photoconductivity; resonant tunnelling diodes; self-assembly; semiconductor quantum dots; InAs-AlAs-GaAs-AlAs; RTD; barrier layer; carrier transport properties; charging effects; double barrier resonant tunneling diode; electrostatic energy; photocurrent; photoexcited holes; photon pulse excitation; quantum amplified characteristics; quantum dot state; resonant tunneling current; self-assembled quantum-dots; single energy level; Gallium arsenide; Lighting; Photoconductivity; Photonics; Quantum dot lasers; Quantum dots; Resonant tunneling devices;
fLanguage
English
Publisher
ieee
Conference_Titel
Numerical Simulation of Optoelectronic Devices (NUSOD), 2012 12th International Conference on
Conference_Location
Shanghai
ISSN
2158-3234
Print_ISBN
978-1-4673-1602-6
Type
conf
DOI
10.1109/NUSOD.2012.6316501
Filename
6316501
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