• DocumentCode
    3496791
  • Title

    The photocurrent of resonant tunneling diode controlled by the charging effects of quantum dots

  • Author

    Zhou, Daming ; Weng, Qianchun ; Wang, Wangping ; Li, Ning ; Zhang, Bo ; Chen, Xiaoshuang ; Lu, Wei ; Wang, Wenxin ; Chen, Hong

  • Author_Institution
    Nat. Lab. for Infrared Phys., Shanghai Inst. of Tech. Phys., Shanghai, China
  • fYear
    2012
  • fDate
    28-31 Aug. 2012
  • Firstpage
    49
  • Lastpage
    50
  • Abstract
    We experimentally studied the photocurrent of AlAs/GaAs/AlAs double barrier resonant tunneling diode (RTD), which is composed of an InAs layer of self-assembled quantum-dots (QDs) on top of the AlAs barrier layer. It is found that the charging InAs quantum dots can effectively modulate the carrier transport properties of the RTD. Moreover, we also found that the resonant tunneling current through a single energy level of an individual quantum dot is extremely sensitive to the photo-excited holes bound nearby the dot, and the presence of the holes lowers the electrostatic energy of the quantum dot state. In addition, it is also observed that the photocurrent can increase step by step with the individual photon pulse excitation when the illumination is low enough. The experiment results well demonstrated the quantum amplified characteristics of the device.
  • Keywords
    III-V semiconductors; aluminium compounds; gallium arsenide; indium compounds; photoconductivity; resonant tunnelling diodes; self-assembly; semiconductor quantum dots; InAs-AlAs-GaAs-AlAs; RTD; barrier layer; carrier transport properties; charging effects; double barrier resonant tunneling diode; electrostatic energy; photocurrent; photoexcited holes; photon pulse excitation; quantum amplified characteristics; quantum dot state; resonant tunneling current; self-assembled quantum-dots; single energy level; Gallium arsenide; Lighting; Photoconductivity; Photonics; Quantum dot lasers; Quantum dots; Resonant tunneling devices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Numerical Simulation of Optoelectronic Devices (NUSOD), 2012 12th International Conference on
  • Conference_Location
    Shanghai
  • ISSN
    2158-3234
  • Print_ISBN
    978-1-4673-1602-6
  • Type

    conf

  • DOI
    10.1109/NUSOD.2012.6316501
  • Filename
    6316501