• DocumentCode
    3496867
  • Title

    Optimization of Copper Indium Gallium Di-Selenide (CIGS) based solar cells by back grading

  • Author

    Ouedraogo, Soumaila ; Sam, R. ; Ouedraogo, Francois ; Kebre, Marcel Bawindsom ; Zougmore, Francois ; Ndjaka, Jean-Marie ; Ouedraogo, Soumaila

  • Author_Institution
    Lab. de Mater. et Environ., Univ. de Ouagadougou, Ouagadougou, Burkina Faso
  • fYear
    2013
  • fDate
    9-12 Sept. 2013
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    We performed modeling and simulation of Cu(In, Ga)Se2 (CIGS) thin film solar cell, using SCAPS-1D device simulator, and we especially investigated the influence of absorber back surface region grading. The band-gap in the back surface region, as well as the thickness of the back surface grading layer, were varied to achieve the optimal performances. Based on these results, an optimal back-grading structure for Cu(In, Ga)Se2 solar cell is proposed. It is shown that, the short-circuit current density (Jsc) improves with increasing the absorber band-gap in the back surface region. Very high Jsc of 32.72 mA/cm2 was obtained, when the band-gap of the absorber near the back contact is 0.2 to 0.5 higher than the absorber bulk band-gap. The Open-circuit Voltage (Voc), the fill factor (FF) and the efficiency (η) of the solar cell decrease for high band-gap near the back contact. The efficiency and the fill factor obtained for our model are respectively 16% and 75%. A comparison with published data for the Cu(In, Ga)Se2 cells shows an excellent agreement.
  • Keywords
    copper compounds; energy gap; gallium compounds; indium compounds; optimisation; selenium compounds; short-circuit currents; solar cells; CIGS; SCAPS 1D device simulator; absorber back surface region grading; absorber bulk band gap; back surface grading layer; efficiency 16 percent; short circuit current density; thin film solar cell; Charge carrier processes; Materials; Mathematical model; Performance evaluation; Photonic band gap; Photovoltaic cells; Short-circuit currents; Cu(In; Ga)Se2; back-grading; simulation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AFRICON, 2013
  • Conference_Location
    Pointe-Aux-Piments
  • ISSN
    2153-0025
  • Print_ISBN
    978-1-4673-5940-5
  • Type

    conf

  • DOI
    10.1109/AFRCON.2013.6757813
  • Filename
    6757813