DocumentCode :
3497050
Title :
Characterizing and evaluating voltage noise in multi-core near-threshold processors
Author :
Xuan Zhang ; Tao Tong ; Kanev, Svilen ; Sae Kyu Lee ; Gu-Yeon Wei ; Brooks, David
Author_Institution :
Harvard Univ., Cambridge, MA, USA
fYear :
2013
fDate :
4-6 Sept. 2013
Firstpage :
82
Lastpage :
87
Abstract :
Lowering the supply voltage to improve energy efficiency leads to higher load current and elevated supply sensitivity. In this paper, we provide the first quantitative analysis of voltage noise in multi-core near-threshold processors in a future 10nm technology across SPEC CPU2006 benchmarks. Our results reveal larger guardband requirement and significant energy efficiency loss due to power delivery nonidealities at near threshold, and highlight the importance of accurate voltage noise characterization for design exploration of energy-centric computing systems using near-threshold cores.
Keywords :
energy conservation; multiprocessing systems; noise; power aware computing; power supply quality; SPEC CPU2006 benchmarks; elevated supply sensitivity; energy efficiency; energy-centric computing systems; guardband requirement; load current; multicore near-threshold processors; power delivery nonidealities; supply voltage; voltage noise characterization; Benchmark testing; Integrated circuit modeling; Multicore processing; Noise; Power system dynamics; Program processors; Transient analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Low Power Electronics and Design (ISLPED), 2013 IEEE International Symposium on
Conference_Location :
Beijing
Print_ISBN :
978-1-4799-1234-6
Type :
conf
DOI :
10.1109/ISLPED.2013.6629271
Filename :
6629271
Link To Document :
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