Title :
A BiCMOS analog front-end circuit for an FDM-based ADSL system
Author :
Langford, D. Scortt ; Tesch, Bruce J. ; Williams, Brian E. ; Nelson, G. Rodney ; Ross, Robert B. ; Bechtel, Gerry R. ; Lewis, Mike G.
Author_Institution :
Harris Corp., Melbourne, FL, USA
Abstract :
This BiCMOS analog front-end (AFE) integrated circuit contains the analog transmit function and a low noise receiver for FDM based ADSL systems. The IC includes a current steered 14-bit 5 Msps D/A converter, laser trimmed third-order reconstruction and anti-alias filters, a programmable attenuator with 200 ohm output drive capability, 60 dB of RX programmable gain and a serial interface. Trimmable thin film resistors allow ±1% filter cutoff frequency and absolute gain accuracy. The multi-tone power ratio performance of the part is approximately 65 dB with a spurious free dynamic range >70 dBc. The CMRR of the RX channel is >90 dB@1.1 MHz. PSRR for transmit and receive are greater than 60 dB. The isolation features of the 1.2 micron BiCMOS technology allow transmit and receive to operate in full-duplex mode with greater than 80 dB of crosstalk isolation. The lip size is 25.8 mm2 which includes bond pads and electrostatic discharge (ESD) protection devices
Keywords :
BiCMOS analogue integrated circuits; analogue processing circuits; attenuators; digital-analogue conversion; frequency division multiplexing; subscriber loops; 1.2 micron; 14 bit; 200 ohm; 60 dB; BiCMOS analog front-end circuit; CMRR; FDM-based ADSL system; RX programmable gain; analog transmit function; anti-alias filters; current steered D/A converter; electrostatic discharge protection; filter cutoff frequency; full-duplex mode; isolation features; laser trimmed third-order reconstruction; lip size; low noise receiver; multi-tone power ratio; output drive capability; programmable attenuator; spurious free dynamic range; thin film resistors; Analog integrated circuits; Attenuators; BiCMOS integrated circuits; Crosstalk; Electrostatic discharge; Filters; Integrated circuit noise; Laser beam cutting; Laser noise; Transistors;
Conference_Titel :
Bipolar/BiCMOS Circuits and Technology Meeting, 1997. Proceedings of the
Conference_Location :
Minneapolis, MN
Print_ISBN :
0-7803-3916-9
DOI :
10.1109/BIPOL.1997.647430
