• DocumentCode
    3497399
  • Title

    A miniature 3D stress measurement module for in-situ stress analysis of heterogeneous system in package devices

  • Author

    Moore, Liam ; Barrett, John

  • Author_Institution
    NIMBUS Centre for Embedded Syst. Res., Cork Inst. of Technol., Cork, Ireland
  • fYear
    2010
  • fDate
    12-14 Jan. 2010
  • Firstpage
    1
  • Lastpage
    9
  • Abstract
    This paper presents an ultra-miniature diagnostic module capable of resolving all nine components of 3-D strain in plastic encapsulated heterogeneous system in package devices (HSIP) and details the correlation between 3-D stress simulations and measurements from the module. HSIP\´s present a multimaterial structure with complex three-dimensional geometry that defies easy multi-physics simulation and prognostic analysis. Accurate measurement of reliability stresses would help in analyzing HSIP reliability and provide data that can be used to verify and calibrate simulations. However, collecting 3D reliability stress data is very difficult without significantly changing the HSIP structure to incorporate measurement devices defeating the objective of characterizing the HSIP itself. This paper demonstrates the use of a miniature, drop-in, 3D stress measurement module for monitoring in-situ 3D stress in HSIP devices over time. The system comprises three miniature, off-the-shelf, three-gauge, rectangular strain rosettes that are positioned so all components of stress can be measured. The rosettes are placed at right angles to each other and are connected to a miniature time-stress measurement device (TSMD) with gauge conditioning circuitry, a 24-bit sigma-delta ADC gauge interface to a microcontroller which sends the data directly to a PC or to an onboard eeprom and on-board temperature sensor for thermal compensation of the gauges. The total size of the module is only 5 ? 5 ? 5 mm. To verify module design and to calibrate it, modules were encapsulated in "dog-bone" test samples using a widely-used epoxy encapsulant. The encapsulated modules were subjected to mechanical loading tests using an Instron mechanical tester and the results of the tests were compared with ANSYS simulations. Since the material properties of the encapsulant are known, the experimentally collected strain data could be converted into stress readings. All 9 components of stress were derived from the- rosettes and the experimental data was found to match Ansys simulations closely. The module is of sufficiently small size that it can be assembled as a component in a HSIP and used for diagnostic and prognostic purposes without compromising the HSIP structure.
  • Keywords
    mechanical testing; strain gauges; strain measurement; stress analysis; 24-bit sigma-delta ADC gauge interface; HSIP structure; Instron mechanical tester; epoxy encapsulant; gauge conditioning circuitry; heterogeneous system; mechanical loading tests; miniature 3D stress measurement module; on-board temperature sensor; package devices; prognostic analysis; reliability; rosettes; strain data; stress analysis; thermal compensation; time-stress measurement device; ultra-miniature diagnostic module; Analytical models; Circuits; Geometry; Monitoring; Plastic packaging; Position measurement; Solid modeling; Strain measurement; Stress measurement; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Prognostics and Health Management Conference, 2010. PHM '10.
  • Conference_Location
    Macao
  • Print_ISBN
    978-1-4244-4756-5
  • Electronic_ISBN
    978-1-4244-4758-9
  • Type

    conf

  • DOI
    10.1109/PHM.2010.5414598
  • Filename
    5414598