DocumentCode :
349758
Title :
Nonlinear circuit fault diagnosis with large change sensitivity
Author :
Worsman, Matthew ; Wong, Mike W T
Author_Institution :
Dept. of Electron. Eng., Hong Kong Polytech. Univ., Hung Hom, Hong Kong
Volume :
2
fYear :
1998
fDate :
1998
Firstpage :
225
Abstract :
Until now, large change sensitivity based fault diagnosis has been limited to the AC frequency domain. This paper presents a method to use large change sensitivity for nonlinear circuit fault diagnosis in the DC domain. Combined with the previous DC technique we propose an algorithm for constructing a nonlinear circuit fault dictionary. Advantages of this algorithm are that the benefits of large change sensitivity, namely computational efficiency, become available for nonlinear circuit testing. The method is restricted to single faults and circuits with one nonlinear resistor. Possible generalisation of the work is also discussed
Keywords :
analogue circuits; circuit optimisation; circuit simulation; fault diagnosis; frequency-domain analysis; nonlinear network analysis; sensitivity analysis; DC frequency domain; analog fault diagnosis; change sensitivity; circuit fault dictionary; circuit testing; computational efficiency; generalisation; nonlinear circuit fault diagnosis; nonlinear resistor; single faults; Circuit faults; Circuit simulation; Circuit testing; Dictionaries; Equations; Fault diagnosis; Frequency; Nonlinear circuits; Observability; Resistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics, Circuits and Systems, 1998 IEEE International Conference on
Conference_Location :
Lisboa
Print_ISBN :
0-7803-5008-1
Type :
conf
DOI :
10.1109/ICECS.1998.814868
Filename :
814868
Link To Document :
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