• DocumentCode
    3497754
  • Title

    Low cost fault tolerant techniques for nano/pico-satellite applications

  • Author

    Botma, P.J. ; Barnard, Arthur ; Steyn, W.H.

  • Author_Institution
    Electr. & Electron. Eng., Electron. Syst. Lab., Stellenbosch, South Africa
  • fYear
    2013
  • fDate
    9-12 Sept. 2013
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Space is a hazardous environment for electronic equipment due to various high energy particles, also referred to as radiation, which adversely affect electronic components. The most notable of these radiation effects are single event latchups and single event upsets. In large and expensive satellites the use of radiation hardened components and redundancy mitigates the effects of radiation on the satellite. These techniques are not feasible on small satellites, especially in the nano to pico range, due to their limited power, size and financial budgets. However, by using fault tolerant design techniques (watchdogs, anti-latchup circuitry, error correction code) and implementing a robust bootloader for in-flight reprogramming, it is possible to achieve an acceptable fault tolerance level for short duration missions within low earth orbit with minimal overhead on the design. These low cost mitigation techniques have been implemented on a CubeSat onboard computer, to be used in the upcoming ZACube2 mission. The evaluation and implementation of these techniques and their impact on the onboard computer in terms of power, size and cost are discussed in this paper.
  • Keywords
    artificial satellites; fault tolerance; radiation hardening (electronics); space vehicle electronics; spacecraft computers; CubeSat onboard computer; ZACube2 mission; electronic components; electronic equipment; high energy particles; in-flight reprogramming; low cost fault tolerant design techniques; low cost mitigation techniques; low earth orbit; nanosatellite applications; onboard computer; picosatellite applications; radiation effects; radiation hardened components; robust bootloader; single event latchups; single event upsets; Fault tolerance; Fault tolerant systems; Radiation effects; Random access memory; Robustness; Satellites; Single event upsets; Embedded; Fault Tolerant; Nanosatellite; Robust; Single Event Effects;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AFRICON, 2013
  • Conference_Location
    Pointe-Aux-Piments
  • ISSN
    2153-0025
  • Print_ISBN
    978-1-4673-5940-5
  • Type

    conf

  • DOI
    10.1109/AFRCON.2013.6757859
  • Filename
    6757859