DocumentCode
3497754
Title
Low cost fault tolerant techniques for nano/pico-satellite applications
Author
Botma, P.J. ; Barnard, Arthur ; Steyn, W.H.
Author_Institution
Electr. & Electron. Eng., Electron. Syst. Lab., Stellenbosch, South Africa
fYear
2013
fDate
9-12 Sept. 2013
Firstpage
1
Lastpage
5
Abstract
Space is a hazardous environment for electronic equipment due to various high energy particles, also referred to as radiation, which adversely affect electronic components. The most notable of these radiation effects are single event latchups and single event upsets. In large and expensive satellites the use of radiation hardened components and redundancy mitigates the effects of radiation on the satellite. These techniques are not feasible on small satellites, especially in the nano to pico range, due to their limited power, size and financial budgets. However, by using fault tolerant design techniques (watchdogs, anti-latchup circuitry, error correction code) and implementing a robust bootloader for in-flight reprogramming, it is possible to achieve an acceptable fault tolerance level for short duration missions within low earth orbit with minimal overhead on the design. These low cost mitigation techniques have been implemented on a CubeSat onboard computer, to be used in the upcoming ZACube2 mission. The evaluation and implementation of these techniques and their impact on the onboard computer in terms of power, size and cost are discussed in this paper.
Keywords
artificial satellites; fault tolerance; radiation hardening (electronics); space vehicle electronics; spacecraft computers; CubeSat onboard computer; ZACube2 mission; electronic components; electronic equipment; high energy particles; in-flight reprogramming; low cost fault tolerant design techniques; low cost mitigation techniques; low earth orbit; nanosatellite applications; onboard computer; picosatellite applications; radiation effects; radiation hardened components; robust bootloader; single event latchups; single event upsets; Fault tolerance; Fault tolerant systems; Radiation effects; Random access memory; Robustness; Satellites; Single event upsets; Embedded; Fault Tolerant; Nanosatellite; Robust; Single Event Effects;
fLanguage
English
Publisher
ieee
Conference_Titel
AFRICON, 2013
Conference_Location
Pointe-Aux-Piments
ISSN
2153-0025
Print_ISBN
978-1-4673-5940-5
Type
conf
DOI
10.1109/AFRCON.2013.6757859
Filename
6757859
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