DocumentCode
3497755
Title
SI-CMOS-MEMS dual mass resonator for extracting mass and spring variations
Author
Fang, Yi ; Mukherjee, Tridib ; Fedder, Gary K.
Author_Institution
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
fYear
2013
fDate
20-24 Jan. 2013
Firstpage
657
Lastpage
660
Abstract
This paper presents Si-CMOS-MEMS dual mass resonators (DMRs) which are fabricated using Si-CMOS-MEMS technology for extracting mass and spring variations. The CMOS chip is fabricated in BiCMOS 0.35 μm process from Jazz Semiconductor. 0.2 μm flatness of the backside silicon over 1.5 mm distance is achieved. The Si-CMOS-MEMS DMR includes proof masses, serpentine spring suspensions and comb fingers and serves as the basic structure for a z-axis differential gimbaled gyroscope. The DMR enables the extraction of process variations by comparing measured frequency response with a geometrically parameterized system-level simulation of the DMR. A model-based methodology is proposed to extract mass and spring variations. Three parameters including in-phase displacement, anti-phase displacement and the difference in displacement between two proof masses in anti-phase mode are chosen to extract the geometrical process variation parameters. The variation between the dual masses is approximately 1.2-1.5% and the spring variation is 3.1%.
Keywords
BiCMOS integrated circuits; CMOS integrated circuits; elemental semiconductors; frequency response; gyroscopes; integrated circuit modelling; microcavities; micromechanical resonators; silicon; BiCMOS process; CMOS chip; Jazz Semiconductor; Si; antiphase displacement; backside silicon flatness; comb fingers; frequency response; geometrical process variation parameters; geometrically-parameterized system-level simulation; in-phase displacement; mass variation extraction; model-based methodology; proof masses; serpentine spring suspensions; silicon-CMOS-MEMS DMR; silicon-CMOS-MEMS dual-mass resonator; size 0.35 mum; spring variation extraction; z-axis differential gimbaled gyroscope; Displacement measurement; Fingers; Frequency measurement; Frequency response; Resonant frequency; Silicon; Springs;
fLanguage
English
Publisher
ieee
Conference_Titel
Micro Electro Mechanical Systems (MEMS), 2013 IEEE 26th International Conference on
Conference_Location
Taipei
ISSN
1084-6999
Print_ISBN
978-1-4673-5654-1
Type
conf
DOI
10.1109/MEMSYS.2013.6474327
Filename
6474327
Link To Document